Quantitative evaluation of local permittivity of semiconductor nanomaterials using microwave atomic force microscopy

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Author(s):  
Minji Zhao ◽  
Bo Tong ◽  
Yasuhiro Kimura ◽  
Yuhki Toku ◽  
Yasuyuki Morita ◽  
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Keyword(s):  
Atomic Force Microscopy ◽  
Quantitative Evaluation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Semiconductor Nanomaterials

scholarly journals Quantitative evaluation of atherosclerotic plaques using cross-polarization optical coherence tomography, nonlinear, and atomic force microscopy

2016 ◽  
Vol 21 (12) ◽  
pp. 126010 ◽  
Author(s):  
Ekaterina V. Gubarkova ◽  
Mikhail Yu. Kirillin ◽  
Varvara V. Dudenkova ◽  
Peter S. Timashev ◽  
Svetlana L. Kotova ◽  
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Keyword(s):  
Atomic Force Microscopy ◽  
Optical Coherence Tomography ◽  
Quantitative Evaluation ◽  
Atherosclerotic Plaques ◽  
Optical Coherence ◽  
Cross Polarization ◽  
Force Microscopy ◽  
Atomic Force

Quantitative Evaluation of SERS-Active Ag Film Nanostructure by Atomic Force Microscopy

1996 ◽  
Vol 68 (3) ◽  
pp. 473-480 ◽  
Author(s):  
Shane E. Roark ◽  
David J. Semin ◽  
Kathy L. Rowlen
Keyword(s):  
Atomic Force Microscopy ◽  
Quantitative Evaluation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Ag Film
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