scholarly journals Viscoplastic drop impact on thin films

2020 ◽  
Vol 891 ◽  
Author(s):  
Samya Sen ◽  
Anthony G. Morales ◽  
Randy H. Ewoldt
Keyword(s):  
Thin Films ◽  
Drop Impact ◽  
Image Position

scholarly journals Thixotropy in viscoplastic drop impact on thin films

2021 ◽  
Vol 6 (4) ◽  
Author(s):  
Samya Sen ◽  
Anthony G. Morales ◽  
Randy H. Ewoldt
Keyword(s):  
Thin Films ◽  
Drop Impact

Synthesis and characterization of Ni incorporated titanium dioxide thin films

2018 ◽  
Vol 33 (24) ◽  
pp. 4165-4172 ◽  
Author(s):  
Deepak Kumar ◽  
Prasanta Mandal ◽  
Anil Singh ◽  
Charu Pant ◽  
Sudesh Sharma
Keyword(s):  
Thin Films ◽  
Titanium Dioxide ◽  
Synthesis And Characterization ◽  
Titanium Dioxide Thin Films ◽  
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Abstract

Microstructure and dielectric properties with CuO additions to liquid phase sintered BaTiO3 thin films

2016 ◽  
Vol 31 (8) ◽  
pp. 1018-1026 ◽  
Author(s):  
David T. Harris ◽  
Matthew J. Burch ◽  
Edward J. Mily ◽  
Elizabeth C. Dickey ◽  
Jon-Paul Maria
Keyword(s):  
Thin Films ◽  
Dielectric Properties ◽  
Liquid Phase ◽  
Image Position

Abstract

Monolithic magneto-optical oxide thin films for on-chip optical isolation

MRS Bulletin ◽  
2018 ◽  
Vol 43 (6) ◽  
pp. 413-418 ◽  
Author(s):  
Qingyang Du ◽  
Takian Fakhrul ◽  
Yan Zhang ◽  
Juejun Hu ◽  
Caroline A. Ross
Keyword(s):  
Thin Films ◽  
Oxide Thin Films ◽  
Optical Isolation ◽  
On Chip ◽  
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Abstract

scholarly journals Role of oligomer structures in the surface chemistry of amidinate metal complexes used for atomic layer deposition of thin films

2019 ◽  
Vol 35 (7) ◽  
pp. 720-731 ◽  
Author(s):  
Jonathan Guerrero-Sánchez ◽  
Bo Chen ◽  
Noboru Takeuchi ◽  
Francisco Zaera
Keyword(s):  
Thin Films ◽  
Atomic Layer Deposition ◽  
Surface Chemistry ◽  
Metal Complexes ◽  
Atomic Layer ◽  
Layer Deposition ◽  
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Abstract

scholarly journals Ti–Si–C–N thin films grown by reactive arc evaporation from Ti3SiC2 cathodes

2011 ◽  
Vol 26 (7) ◽  
pp. 874-881 ◽  
Author(s):  
Anders O. Eriksson ◽  
Jianqiang Zhu ◽  
Naureen Ghafoor ◽  
Jens Jensen ◽  
Grzegorz Greczynski ◽  
...  
Keyword(s):  
Thin Films ◽  
Image Position ◽  
Arc Evaporation

Abstract

Stresses in Multilayered Thin Films

MRS Bulletin ◽  
1999 ◽  
Vol 24 (2) ◽  
pp. 34-38 ◽  
Author(s):  
Robert C. Cammarata ◽  
John C. Bilello ◽  
A. Lindsay Greer ◽  
Karl Sieradzki ◽  
Steven M. Yalisove
Keyword(s):  
Thin Films ◽  
Angular Displacement ◽  
Incident Beam ◽  
Two Dimensions ◽  
Bragg Angle ◽  
Radius Of Curvature ◽  
Wave Source ◽  
Contour Maps ◽  
Film Substrate ◽  
Image Position

Almost all thin films deposited on a substrate are in a state of stress. Fifty years ago pioneering work concerning the measurement of thin-film stresses was conducted by Brenner and Senderoff. They electroplated a metal film onto a thin metal substrate strip fixed at one end and measured the deflection of the free end of the substrate with a micrometer. Using a beam-bending analysis, they were able to calculate a residual stress from the measured deflection of the bimetallic film-substrate system. A variety of other, more sensitive methods of measuring the curvature of the surface of a film-substrate system have since been developed using, for example, capacitance measurements and interferometry techniques.When a monochromatic x-ray beam is incident onto a curved single crystal, the diffraction condition is satisfied only for regions of the crystal where the inclination angle with respect to the incident beam exactly matches the Bragg angle. When a parallel beam plane-wave source is used, the diffracted beam from a particular set of (hkl) planes gives rise to a single narrow-contour band. If the crystal is rocked by an angle ω, the contour band will move by a certain distance D. The radius of curvature R of the crystal lattice planes is given bywhere θ is the Bragg angle. Equal rocking angles produce equivalent D values for uniform curvature, or varied D values for nonuniform curvature. Using this procedure, detailed contour maps of the angular displacement field of the crystal can be mapped in two dimensions.

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