Heat dissipation assessment of through silicon via (TSV)-based 3D IC packaging for CMOS image sensing

2016 ◽  
Vol 59 ◽  
pp. 84-94 ◽  
Author(s):  
Hsien-Chie Cheng ◽  
Tzu-Chin Huang ◽  
Po-Wen Hwang ◽  
Wen-Hwa Chen
Author(s):  
John H. Lau

3D integration consists of 3D IC packaging, 3D IC integration, and 3D Si integration. They are different and in general the TSV (through-silicon via) separates 3D IC packaging from 3D IC integration and 3D Si integration since the latter two use TSV but 3D IC packaging does not. TSV (with a new concept that every chip could have two surfaces with circuits) is the focus of this investigation. State-of-the-art, key differences, trends of these three technologies, and a 3D integration roadmap are presented.


2009 ◽  
Vol 27 (3) ◽  
pp. 4-9
Author(s):  
Seung-Min Hyun ◽  
Chang-Woo Lee

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