Reliability challenges in 3D IC packaging technology

2011 ◽  
Vol 51 (3) ◽  
pp. 517-523 ◽  
Author(s):  
K.N. Tu
2009 ◽  
Vol 27 (3) ◽  
pp. 4-9
Author(s):  
Seung-Min Hyun ◽  
Chang-Woo Lee

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