Determination of elastic constants of plasma polymerized thin films using the vibrating piezoelectric resonator

1984 ◽  
Vol 34 (3) ◽  
pp. 208-215 ◽  
Author(s):  
J. Suchánek ◽  
J. Janča
Keyword(s):  
Thin Films ◽  
Elastic Constants ◽  
Piezoelectric Resonator

The Determination of Mechanical Parameters and Residual Stresses for Thin Films Using Micro-Cantilever Beams

1988 ◽  
Vol 130 ◽  
Author(s):  
S. Hong ◽  
T. P. Weihs ◽  
J. C. Bravman ◽  
W. D. Nix
Keyword(s):  
Thin Films ◽  
Residual Stresses ◽  
Elastic Constants ◽  
Testing Machine ◽  
Elastic Response ◽  
Cantilever Beams ◽  
Mechanical Parameters ◽  
Processing Technologies ◽  
Micro Cantilever

AbstractA method for determining mechanical parameters and residual stresses for thin films is described. Multi-layer cantilever beams (LPCVD SiNx/thermal SiO2) are fabricated utilizing standard IC processing technologies and micromachining of silicon. The elastic response of the beams to imposed deflections is then measured using a Nanoindenter, a sub-micron hardness testing machine. The elastic constants of the nitride films are calculated from the force vs. deflection slope and known elastic constants of the thermal SiO2 and silicon. By measuring the curvature of the multi-layer cantilever beams with a scanning electron microscope after successive etching of the LPCVD nitride films, average and differential stresses in the films were calculated.

Determination of the Mechanical Properties of Polysilicon Thin Films Using Bulge Testing

1997 ◽  
Vol 505 ◽  
Author(s):  
S. Jayaraman ◽  
R. L. Edwards ◽  
K. J. Hemker
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
Elastic Constants ◽  
Polycrystalline Silicon ◽  
Silicon Substrates ◽  
Bulge Testing ◽  
Good Agreement

ABSTRACTUsing standard deposition and micromachining techniques, silicon substrates with square and rectangular windows covered with membranes of polycrystalline silicon (polysilicon) have been fabricated. Pressure-displacement curves obtained during the bulge testing of membranes with the above geometries have been used to determine the elastic constants E and v of the polysilicon. The results obtained (E = 162± 4 GPa and v = 0.19±0.03) are in good agreement with literature values for bulk polycrystalline silicon.

Determination of elastic constants in thin films using hydrogen loading

1999 ◽  
Vol 74 (5) ◽  
pp. 647-649 ◽  
Author(s):  
U. Laudahn ◽  
S. Fähler ◽  
H. U. Krebs ◽  
A. Pundt ◽  
M. Bicker ◽  
...  
Keyword(s):  
Thin Films ◽  
Elastic Constants

Determination of the x-ray elastic constants of solid thin films

2007 ◽  
Vol 16 (2) ◽  
pp. 487-492 ◽  
Author(s):  
Y H Yu ◽  
M O Lai ◽  
L Lu
Keyword(s):  
Thin Films ◽  
Elastic Constants ◽  
X Ray ◽  
Solid Thin Films

Determination of Elastic Constants and Viscosity of Amorphous Thin Films From Substrate Curvature

1990 ◽  
Vol 188 ◽  
Author(s):  
Ann Witvrouw ◽  
Frans Spaepen
Keyword(s):  
Thin Films ◽  
Viscous Flow ◽  
Elastic Constants ◽  
Activation Enthalpy ◽  
Amorphous Thin Films ◽  
Curvature Measurements ◽  
Substrate Curvature

ABSTRACTSubstrate curvature measurements were used to monitor viscous flow in Pd79Si21 films at temperatures between 100 and 250°C. To determine the viscosity and the change in viscosity the elastic constants of the film were measured by depositing films on pre-bent substrates: E = 10 ± 1 1010 Pa and ν = 0.43 ± 0.04 The activation enthalpy for η is 13 ± 1 kJ/mole.

Elastic Properties and Stresses in Polyimide thin Films and Coatings

1994 ◽  
Vol 356 ◽  
Author(s):  
Kapil C. Sheth ◽  
Michael Chen ◽  
Richard J. Farris
Keyword(s):  
Thin Films ◽  
Residual Stresses ◽  
Real Time ◽  
Elastic Properties ◽  
Elastic Constants ◽  
Holographic Interferometry ◽  
Moisture Diffusion ◽  
Complex Geometries ◽  
Diffusion Constants

AbstractPolyimide thin films and coatings (< 20μm) for electronic applications have been fully characterized. Analysis of residual stresses and determination of all 21 anisotropic constants are necessary for a better understanding of these coatings in complex geometries. The residual stresses have been measured by a real-time vibrational holographic interferometry technique. The number of elastic constants is reduced to 9 independent constants by finding the orthotopic axes. All the 9 orthotropic constants - 3 normal compliances, 3 shear compliances and 3 independent Poisson’s ratios - have been determined. Moisture diffusion constants have also been measured.

Sign in / Sign up

Export Citation Format

Share Document