A general purpose design-for-test methodology at the analog-digital boundary of mixed-signal VLSI

Johan Verfaillie; Didier Haspeslagh

doi:10.1007/bf00137568

A general purpose design-for-test methodology at the analog-digital boundary of mixed-signal VLSI

Journal of Electronic Testing ◽

10.1007/bf00137568 ◽

1996 ◽

Vol 9 (1-2) ◽

pp. 109-115 ◽

Cited By ~ 5

Author(s):

Johan Verfaillie ◽

Didier Haspeslagh

Keyword(s):

General Purpose ◽

Design For Test ◽

Mixed Signal ◽

Test Methodology

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Design for Test Approaches to Mixed-Signal Testing

Proceedings International Test Conference 1992 ◽

10.1109/test.1992.527874 ◽

2005 ◽

Cited By ~ 9

Author(s):

M. Jarwala

Keyword(s):

Design For Test ◽

Mixed Signal ◽

Mixed Signal Testing

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Towards a general purpose mixed-signal instrumentation layer in the die stack of a 3D-SIC

2014 19th IEEE European Test Symposium (ETS) ◽

10.1109/ets.2014.6847832 ◽

2014 ◽

Cited By ~ 1

Author(s):

Shudong Lin ◽

Gordon W. Roberts

Keyword(s):

General Purpose ◽

Mixed Signal

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Extending Design-for-Test Into the Analog and Mixed-Signal Domains

AT&T Technical Journal ◽

10.1002/j.1538-7305.1994.tb00578.x ◽

1994 ◽

Vol 73 (2) ◽

pp. 49-55 ◽

Cited By ~ 3

Author(s):

Philip V. Lopresti

Keyword(s):

Design For Test ◽

Mixed Signal

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Mixed-signal SoC testing: is mixed-signal design-for-test on its way?

Proceedings of the Ninth Asian Test Symposium ◽

10.1109/ats.2000.893595 ◽

2005 ◽

Author(s):

Chin-Long Wey ◽

A. Osseiran ◽

J.L. Huertas

Keyword(s):

Design For Test ◽

Signal Design ◽

Mixed Signal ◽

Soc Testing

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Speed Enhanced Mixed Signal Design-for-Test Using Hybrid Fault Based Testing Algorithms

2010 Second International Conference on Computer Modeling and Simulation ◽

10.1109/iccms.2010.138 ◽

2010 ◽

Author(s):

Sushanth Puthiyottil ◽

E. Sureshkumar

Keyword(s):

Design For Test ◽

Signal Design ◽

Mixed Signal ◽

Testing Algorithms

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Design-for-test methodology for Motorola PowerPC/sup TM/ microprocessors

International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034) ◽

10.1109/test.1999.805812 ◽

2003 ◽

Cited By ~ 11

Author(s):

M. Abadir ◽

R. Raina

Keyword(s):

Design For Test ◽

Test Methodology

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Mixed-signal custom IC control processors incorporating design for test/self-test

10.1049/ic:19971002 ◽

1997 ◽

Author(s):

I.A. Grout

Keyword(s):

Design For Test ◽

Mixed Signal ◽

Self Test

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Design-for-Test of Mixed-Signal Integrated Circuits

2006 49th IEEE International Midwest Symposium on Circuits and Systems ◽

10.1109/mwscas.2006.382189 ◽

2006 ◽

Author(s):

Adoracion Rueda ◽

Jose L. Huertas

Keyword(s):

Integrated Circuits ◽

Design For Test ◽

Mixed Signal

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Test and Design-for-Test of Mixed-Signal Integrated Circuits

Information Technology - IFIP International Federation for Information Processing ◽

10.1007/1-4020-8159-6_7 ◽

2006 ◽

pp. 183-212

Author(s):

Marcelo Lubaszewski ◽

Jose Luis Huertas

Keyword(s):

Integrated Circuits ◽

Design For Test ◽

Mixed Signal

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Achieving design closure in a typical mixed-signal ASIC; a Design-For-Test centric approach.

10.1109/icecs.2005.4633429 ◽

2005 ◽

Author(s):

Sverre Wichlund

Keyword(s):

Design For Test ◽

Mixed Signal ◽

Design Closure

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