Achieving design closure in a typical mixed-signal ASIC; a Design-For-Test centric approach.

Design for Test Approaches to Mixed-Signal Testing

Proceedings International Test Conference 1992 ◽

10.1109/test.1992.527874 ◽

2005 ◽

Cited By ~ 9

Author(s):

M. Jarwala

Keyword(s):

Design For Test ◽

Mixed Signal ◽

Mixed Signal Testing

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Extending Design-for-Test Into the Analog and Mixed-Signal Domains

AT&T Technical Journal ◽

10.1002/j.1538-7305.1994.tb00578.x ◽

1994 ◽

Vol 73 (2) ◽

pp. 49-55 ◽

Cited By ~ 3

Author(s):

Philip V. Lopresti

Keyword(s):

Design For Test ◽

Mixed Signal

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Mixed-signal SoC testing: is mixed-signal design-for-test on its way?

Proceedings of the Ninth Asian Test Symposium ◽

10.1109/ats.2000.893595 ◽

2005 ◽

Author(s):

Chin-Long Wey ◽

A. Osseiran ◽

J.L. Huertas

Keyword(s):

Design For Test ◽

Signal Design ◽

Mixed Signal ◽

Soc Testing

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Speed Enhanced Mixed Signal Design-for-Test Using Hybrid Fault Based Testing Algorithms

2010 Second International Conference on Computer Modeling and Simulation ◽

10.1109/iccms.2010.138 ◽

2010 ◽

Author(s):

Sushanth Puthiyottil ◽

E. Sureshkumar

Keyword(s):

Design For Test ◽

Signal Design ◽

Mixed Signal ◽

Testing Algorithms

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A general purpose design-for-test methodology at the analog-digital boundary of mixed-signal VLSI

Journal of Electronic Testing ◽

10.1007/bf00137568 ◽

1996 ◽

Vol 9 (1-2) ◽

pp. 109-115 ◽

Cited By ~ 5

Author(s):

Johan Verfaillie ◽

Didier Haspeslagh

Keyword(s):

General Purpose ◽

Design For Test ◽

Mixed Signal ◽

Test Methodology

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Mixed-signal custom IC control processors incorporating design for test/self-test

10.1049/ic:19971002 ◽

1997 ◽

Author(s):

I.A. Grout

Keyword(s):

Design For Test ◽

Mixed Signal ◽

Self Test

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Design-for-Test of Mixed-Signal Integrated Circuits

2006 49th IEEE International Midwest Symposium on Circuits and Systems ◽

10.1109/mwscas.2006.382189 ◽

2006 ◽

Author(s):

Adoracion Rueda ◽

Jose L. Huertas

Keyword(s):

Integrated Circuits ◽

Design For Test ◽

Mixed Signal

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Test and Design-for-Test of Mixed-Signal Integrated Circuits

Information Technology - IFIP International Federation for Information Processing ◽

10.1007/1-4020-8159-6_7 ◽

2006 ◽

pp. 183-212

Author(s):

Marcelo Lubaszewski ◽

Jose Luis Huertas

Keyword(s):

Integrated Circuits ◽

Design For Test ◽

Mixed Signal

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Design-for-test strategies for analogue and mixed-signal integrated circuits

38th Midwest Symposium on Circuits and Systems. Proceedings ◽

10.1109/mwscas.1995.510297 ◽

2002 ◽

Cited By ~ 3

Author(s):

A. Richardson ◽

T. Olbrich ◽

V. Liberali ◽

F. Maloberti

Keyword(s):

Integrated Circuits ◽

Design For Test ◽

Mixed Signal ◽

Test Strategies

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Design-for-test methodologies for current tests in Analog/Mixed-Signal Power SOCs

2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS) ◽

10.1109/mwscas.2012.6292205 ◽

2012 ◽

Cited By ~ 4

Author(s):

Kemal Kulovic ◽

Samed Maltabas ◽

Martin Margala

Keyword(s):

Design For Test ◽

Signal Power ◽

Mixed Signal

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