The study of ESD induced defects in smart power ESD protection circuits using low frequency noise measurements

2008 ◽  
Vol 205 (11) ◽  
pp. 2544-2547
Author(s):  
J. Hadzi-Vukovic ◽  
M. Jevtic ◽  
M. Glavanovics ◽  
H. Rothleitner
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Smart Power ◽  
Esd Protection ◽  
Noise Measurements ◽  
Protection Circuits ◽  
Induced Defects

scholarly journals LOW-FREQUENCY NOISE MEASUREMENTS OF IR PHOTODETECTORS WITH VOLTAGE CROSS CORRELATION SYSTEM

Measurement ◽  
2021 ◽  
pp. 109867
Author(s):  
Krzysztof ACHTENBERG ◽  
Janusz MIKOŁAJCZYK ◽  
Carmine CIOFI ◽  
Graziella SCANDURRA ◽  
Krystian MICHALCZEWSKI ◽  
...  
Keyword(s):  
Cross Correlation ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Ir Photodetectors ◽  
Noise Measurements ◽  
Correlation System

Low-Frequency Noise Measurements as a Quality Indicator for Ohmic Contacts to n-GaN

2003 ◽  
Vol 433-436 ◽  
pp. 677-680 ◽  
Author(s):  
Nobuhisa Tanuma ◽  
Hirokazu Tanizaki ◽  
Saburo Yokokura ◽  
T. Matsui ◽  
Sumihisa Hashiguchi ◽  
...  
Keyword(s):  
Quality Indicator ◽  
Ohmic Contacts ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Measurements
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