Low-frequency noise measurements as a characterization and testing tool in microelectronics

1993 ◽  
Author(s):  
Zeynep Çelik-Butler
Measurement ◽  
2021 ◽  
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Janusz MIKOŁAJCZYK ◽  
Carmine CIOFI ◽  
Graziella SCANDURRA ◽  
Krystian MICHALCZEWSKI ◽  
...  

2003 ◽  
Vol 433-436 ◽  
pp. 677-680 ◽  
Author(s):  
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Hirokazu Tanizaki ◽  
Saburo Yokokura ◽  
T. Matsui ◽  
Sumihisa Hashiguchi ◽  
...  

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