2013 IEEE International Integrated Reliability Workshop Final Report
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9781479903528, 9781479903504, 9781479903511
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Deformation of octahedron slotted metal tracks

2013 ◽  
Author(s):  
Jorg Kludt ◽  
Kirsten Weide-Zaage ◽  
Markus Ackermann ◽  
Verena Hein

RF reliability of gate last InGaAs nMOSFETs with high-k dielectric

2013 ◽  
Author(s):  
Guntrade Roll ◽  
Mikael Egard ◽  
Sofia Johannson ◽  
Lars Ohlsson ◽  
Lars-Erik Wernersson ◽  
...  
Keyword(s):  
High K ◽  
High K Dielectric

Comparison of NTBI and irradiation induced interface states

2013 ◽  
Author(s):  
K. E. Kambour ◽  
D. D. Nguyen ◽  
C. Kouhestani ◽  
R. A. B. Devine
Keyword(s):  
Interface States

(Late) Essential ingredients for modeling of hot-carrier degradation in ultra-scaled MOSFETs

2013 ◽  
Author(s):  
Stanislav Tyaginov ◽  
Markus Bina ◽  
Jacopo Franco ◽  
Dmitri Osintsev ◽  
Yannick Wimmer ◽  
...  
Keyword(s):  
Hot Carrier ◽  
Hot Carrier Degradation
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