scholarly journals Progress and Perspectives of Atomically Engineered Perovskite Oxide Interfaces for Electronics and Electrocatalysts

2019 ◽  
Vol 6 (15) ◽  
pp. 1900547 ◽  
Author(s):  
Yunzhong Chen ◽  
Robert J. Green
2017 ◽  
Vol 4 (11) ◽  
pp. 1700144 ◽  
Author(s):  
Alessio Giampietri ◽  
Giovanni Drera ◽  
Luigi Sangaletti

Hyomen Kagaku ◽  
2007 ◽  
Vol 28 (1) ◽  
pp. 9-14
Author(s):  
Akihito SAWA ◽  
Takeshi FUJII ◽  
Masashi KAWASAKI ◽  
Yoshinori TOKURA

2005 ◽  
Vol 902 ◽  
Author(s):  
Elke Beyreuther ◽  
Stefan Grafström ◽  
Christian Thiele ◽  
Kathrin Dörr ◽  
Lukas M. Eng

AbstractIn the present study, we comparatively investigate the distribution of electronic interface states of three different perovskite oxide interfaces, formed by epitaxial thin films of La0.7Sr0.3MnO3 (LSMO), La0.7Ca0.3MnO3 (LCMO), and La0.7Ce0.3MnO3 (LCeMO) on SrTiO3(100) substrates, in the as-prepared state as well as after an annealing procedure. We find that annealing significantly reduces the number and density of interface trap states. Two different experimental realizations of the surface photovoltage spectroscopy (SPS) technique were employed: an approach based on X-ray photoelectron spectroscopy (XPS), as well as a capacitive method. The advantages and limitations of both methods are critically discussed.


2007 ◽  
Vol 13 (S02) ◽  
Author(s):  
L Fitting Kourkoutis ◽  
Y Hotta ◽  
T Susaki ◽  
N Nakagawa ◽  
HY Hwang ◽  
...  

2015 ◽  
Vol 106 (7) ◽  
pp. 071601 ◽  
Author(s):  
Joohwi Lee ◽  
Jong Kwon Choi ◽  
Seon Young Moon ◽  
Jaehong Park ◽  
Jin-Sang Kim ◽  
...  

2011 ◽  
Vol 110 (5) ◽  
pp. 053707 ◽  
Author(s):  
T. Yamamoto ◽  
R. Yasuhara ◽  
I. Ohkubo ◽  
H. Kumigashira ◽  
M. Oshima

1985 ◽  
Vol 46 (C4) ◽  
pp. C4-135-C4-140 ◽  
Author(s):  
M. Leseur ◽  
B. Pieraggi

1990 ◽  
Vol 51 (C1) ◽  
pp. C1-781-C1-787
Author(s):  
B. BONVALOT ◽  
G. DHALENNE ◽  
F. MILLOT ◽  
A. REVCOLEVSCHI

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