Band Alignment at Heteroepitaxial Perovskite Oxide Interfaces. Experiments, Methods, and Perspectives

2017 ◽  
Vol 4 (11) ◽  
pp. 1700144 ◽  
Author(s):  
Alessio Giampietri ◽  
Giovanni Drera ◽  
Luigi Sangaletti
Keyword(s):  
Band Alignment ◽  
Perovskite Oxide ◽  
Oxide Interfaces

scholarly journals Band alignment at memristive metal-oxide interfaces investigated by hard x-ray photoemission spectroscopy

2014 ◽  
Vol 90 (11) ◽  
Author(s):  
C. Lenser ◽  
A. Köhl ◽  
M. Patt ◽  
C. M. Schneider ◽  
R. Waser ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Band Alignment ◽  
Photoemission Spectroscopy ◽  
Oxide Interfaces ◽  
X Ray

(Invited) Electron Band Alignment at Ge/Oxide and AIII-BV/Oxide Interfaces from Internal Photoemission Experiments

2013 ◽  
Vol 58 (7) ◽  
pp. 311-316 ◽  
Author(s):  
V. V. Afanas'ev ◽  
H.- Y. Chou ◽  
M. Houssa ◽  
A. Stesmans
Keyword(s):  
Band Alignment ◽  
Oxide Interfaces ◽  
Electron Band ◽  
Internal Photoemission

Opportunity for band alignment manipulation of perovskite oxide stacks by interfacial dipole layer formation

2021 ◽  
pp. 108128
Author(s):  
Atsushi Tamura ◽  
Seungwoo Jang ◽  
Young-Geun Park ◽  
Hanjin Lim ◽  
Koji Kita
Keyword(s):  
Band Alignment ◽  
Perovskite Oxide ◽  
Layer Formation ◽  
Dipole Layer

scholarly journals Resistance Switching Effect at Perovskite-Oxide Interfaces

Hyomen Kagaku ◽  
2007 ◽  
Vol 28 (1) ◽  
pp. 9-14
Author(s):  
Akihito SAWA ◽  
Takeshi FUJII ◽  
Masashi KAWASAKI ◽  
Yoshinori TOKURA
Keyword(s):  
Resistance Switching ◽  
Perovskite Oxide ◽  
Switching Effect ◽  
Oxide Interfaces

Surface Photovoltage Spectroscopy for the Investigation of Perovskite Oxide Interfaces

2005 ◽  
Vol 902 ◽  
Author(s):  
Elke Beyreuther ◽  
Stefan Grafström ◽  
Christian Thiele ◽  
Kathrin Dörr ◽  
Lukas M. Eng
Keyword(s):  
Photoelectron Spectroscopy ◽  
Perovskite Oxide ◽  
Surface Photovoltage ◽  
Epitaxial Thin Films ◽  
Trap States ◽  
Oxide Interfaces ◽  
X Ray ◽  
Surface Photovoltage Spectroscopy ◽  
Prepared State ◽  
Capacitive Method

AbstractIn the present study, we comparatively investigate the distribution of electronic interface states of three different perovskite oxide interfaces, formed by epitaxial thin films of La0.7Sr0.3MnO3 (LSMO), La0.7Ca0.3MnO3 (LCMO), and La0.7Ce0.3MnO3 (LCeMO) on SrTiO3(100) substrates, in the as-prepared state as well as after an annealing procedure. We find that annealing significantly reduces the number and density of interface trap states. Two different experimental realizations of the surface photovoltage spectroscopy (SPS) technique were employed: an approach based on X-ray photoelectron spectroscopy (XPS), as well as a capacitive method. The advantages and limitations of both methods are critically discussed.

Probing Electronic Structure Changes at Perovskite Oxide Interfaces Using Spatially Resolved EELS

2007 ◽  
Vol 13 (S02) ◽  
Author(s):  
L Fitting Kourkoutis ◽  
Y Hotta ◽  
T Susaki ◽  
N Nakagawa ◽  
HY Hwang ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Perovskite Oxide ◽  
Oxide Interfaces ◽  
Spatially Resolved ◽  
Structure Changes
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