Proceedings. 2005 IEEE International Workshop on Current and Defect Based Testing, 2005. DBT 2005.
Latest Publications

TOTAL DOCUMENTS

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

1424400341

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Sensitivity analysis of quiescent signal analysis for defect detection

Proceedings. 2005 IEEE International Workshop on Current and Defect Based Testing, 2005. DBT 2005. ◽

10.1109/dbt.2005.1531294 ◽

2005 ◽

Author(s):

D. Acharyya ◽

A. Singh ◽

M. Tehranipoor ◽

C. Patel ◽

J. Plusquellic

Keyword(s):

Sensitivity Analysis ◽

Defect Detection ◽

Signal Analysis ◽

Quiescent Signal Analysis

Download Full-text

On the test quality evaluation of current testing techniques

Proceedings. 2005 IEEE International Workshop on Current and Defect Based Testing, 2005. DBT 2005. ◽

10.1109/dbt.2005.1531296 ◽

2005 ◽

Cited By ~ 1

Author(s):

C. Thibeault

Keyword(s):

Quality Evaluation ◽

Test Quality ◽

Current Testing ◽

Testing Techniques

Download Full-text

Structural test with functional characteristics

Proceedings. 2005 IEEE International Workshop on Current and Defect Based Testing, 2005. DBT 2005. ◽

10.1109/dbt.2005.1531302 ◽

2005 ◽

Cited By ~ 2

Author(s):

B. Nadeau-Dostie ◽

M. Mahmud ◽

J.-F.F. Maamari

Keyword(s):

Functional Characteristics ◽

Structural Test

Download Full-text

Electrical analysis of a domino logic cell with GOS faults

Proceedings. 2005 IEEE International Workshop on Current and Defect Based Testing, 2005. DBT 2005. ◽

10.1109/dbt.2005.1531299 ◽

2005 ◽

Author(s):

M. Comte ◽

S. Ohtake ◽

H. Fujiwara ◽

M. Renovell

Keyword(s):

Domino Logic ◽

Electrical Analysis

Download Full-text

Electrical and topological characterization of interconnect open defects

Proceedings. 2005 IEEE International Workshop on Current and Defect Based Testing, 2005. DBT 2005. ◽

10.1109/dbt.2005.1531300 ◽

2005 ◽

Cited By ~ 6

Author(s):

R. Rodriguez-Montanes ◽

J. Figueras

Keyword(s):

Topological Characterization ◽

Open Defects

Download Full-text

Technology scaling issues of an iddq built-in current sensor

Proceedings. 2005 IEEE International Workshop on Current and Defect Based Testing, 2005. DBT 2005. ◽

10.1109/dbt.2005.1531295 ◽

2005 ◽

Author(s):

Bin Xue ◽

D.M.H. Walker

Keyword(s):

Current Sensor ◽

Technology Scaling

Download Full-text

Current testing for nanotechnologies: a demystifying application perspective

Proceedings. 2005 IEEE International Workshop on Current and Defect Based Testing, 2005. DBT 2005. ◽

10.1109/dbt.2005.1531303 ◽

2005 ◽

Cited By ~ 4

Author(s):

H. Manhaeve

Keyword(s):

Current Testing

Download Full-text

Simulation modeling and testing of SRAMs using dynamic current

Proceedings. 2005 IEEE International Workshop on Current and Defect Based Testing, 2005. DBT 2005. ◽

10.1109/dbt.2005.1531306 ◽

2005 ◽

Author(s):

S. Kumar ◽

S. Thomas ◽

R. Makki ◽

A. Chehab ◽

A. Kayssi

Keyword(s):

Simulation Modeling

Download Full-text

An introduction to computer algorithms designed to facilitate I/sub DDT/ current testing of CMOS circuits

Proceedings. 2005 IEEE International Workshop on Current and Defect Based Testing, 2005. DBT 2005. ◽

10.1109/dbt.2005.1531307 ◽

2005 ◽

Cited By ~ 2

Author(s):

S. Thomas

Keyword(s):

Cmos Circuits ◽

Computer Algorithms ◽

Current Testing

Download Full-text

Data size reduction for clustering-based binning of ICs using principal component analysis (PCA)

Proceedings. 2005 IEEE International Workshop on Current and Defect Based Testing, 2005. DBT 2005. ◽

10.1109/dbt.2005.1531298 ◽

2005 ◽

Cited By ~ 4

Author(s):

A.S. Banthia ◽

A.P. Jayasumana ◽

Y.K. Malaiya

Keyword(s):

Principal Component Analysis ◽

Principal Component ◽

Component Analysis ◽

Size Reduction

Download Full-text

Proceedings. 2005 IEEE International Workshop on Current and Defect Based Testing, 2005. DBT 2005.Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Sensitivity analysis of quiescent signal analysis for defect detection

On the test quality evaluation of current testing techniques

Structural test with functional characteristics

Electrical analysis of a domino logic cell with GOS faults

Electrical and topological characterization of interconnect open defects

Technology scaling issues of an iddq built-in current sensor

Current testing for nanotechnologies: a demystifying application perspective

Simulation modeling and testing of SRAMs using dynamic current

An introduction to computer algorithms designed to facilitate I/sub DDT/ current testing of CMOS circuits

Data size reduction for clustering-based binning of ICs using principal component analysis (PCA)

Proceedings. 2005 IEEE International Workshop on Current and Defect Based Testing, 2005. DBT 2005.
Latest Publications