Scanning Probe Microscopy-Physical Property Characterization at Nanoscale
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Published By Intech

9789535105763

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Elastic and Nanowearing Properties of SiO2-PMMA and Hybrid Coatings Evaluated by Atomic Force Acoustic Microscopy and Nanoindentation"

Scanning Probe Microscopy-Physical Property Characterization at Nanoscale ◽

10.5772/36219 ◽

2012 ◽

Cited By ~ 1

Author(s):

J. Alvarado-Rivera ◽

J. Muoz-Saldaa ◽

R. Ramrez-Bo

Keyword(s):

Acoustic Microscopy ◽

Hybrid Coatings ◽

Atomic Force

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Characterization of Complex Spintronic and Superconducting Structures by Atomic Force Microscopy Techniques

Scanning Probe Microscopy-Physical Property Characterization at Nanoscale ◽

10.5772/37302 ◽

2012 ◽

Author(s):

L. Ciontea ◽

M.S. Gabor ◽

T. Petrisor ◽

T. Ristoiu ◽

C. Tiusan ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Techniques

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Polyamide-Imide Membranes of Various Morphology - Features of Nano-Scale Elements of Structure

Scanning Probe Microscopy-Physical Property Characterization at Nanoscale ◽

10.5772/37235 ◽

2012 ◽

Cited By ~ 1

Author(s):

S.V. Kononova ◽

G.N. Gubanova ◽

K.A. Romashkova ◽

E.N. Korytkova ◽

D. Timpu

Keyword(s):

Nano Scale

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Tuning Fork Scanning Probe Microscopes - Applications for the Nano-Analysis of the Material Surface and Local Physico-Mechanical Properties

Scanning Probe Microscopy-Physical Property Characterization at Nanoscale ◽

10.5772/36187 ◽

2012 ◽

Author(s):

Vo Thanh ◽

S.A. Chizhik ◽

Tran Xuan ◽

Nguyen Trong ◽

V.V. Chikunov

Keyword(s):

Mechanical Properties ◽

Tuning Fork ◽

Scanning Probe ◽

Material Surface

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Microtribological Behavior of Polymer-Nanoparticle Thin Film with AFM

Scanning Probe Microscopy-Physical Property Characterization at Nanoscale ◽

10.5772/35315 ◽

2012 ◽

Author(s):

Xue Feng ◽

Shao Xian ◽

Han Y

Keyword(s):

Thin Film ◽

Polymer Nanoparticle

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Estimation of Grain Boundary Sliding During Ambient-Temperature Creep in Hexagonal Close-Packed Metals Using Atomic Force Microscope

Scanning Probe Microscopy-Physical Property Characterization at Nanoscale ◽

10.5772/35640 ◽

2012 ◽

Cited By ~ 1

Author(s):

Tetsuya Matsunaga ◽

Eiichi Sato

Keyword(s):

Grain Boundary ◽

Ambient Temperature ◽

Atomic Force Microscope ◽

Grain Boundary Sliding ◽

Hexagonal Close Packed ◽

Temperature Creep ◽

Atomic Force ◽

Boundary Sliding

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Statistical Analysis in Homopolymeric Surfaces

Scanning Probe Microscopy-Physical Property Characterization at Nanoscale ◽

10.5772/36461 ◽

2012 ◽

Cited By ~ 1

Author(s):

Eralci M. ◽

Maria L. ◽

Roberto M. ◽

Alexandre Marlett

Keyword(s):

Statistical Analysis

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Nanomechanical Evaluation of Ultrathin Lubricant Films on Magnetic Disks by Atomic Force Microscopy

Scanning Probe Microscopy-Physical Property Characterization at Nanoscale ◽

10.5772/37245 ◽

2012 ◽

Author(s):

Shojiro Miyake ◽

Mei Wang

Keyword(s):

Atomic Force Microscopy ◽

Magnetic Disks ◽

Force Microscopy ◽

Atomic Force ◽

Lubricant Films

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Multiple Material Property Characterization Using Induced Currents and Atomic Force Microscopy

Scanning Probe Microscopy-Physical Property Characterization at Nanoscale ◽

10.5772/35594 ◽

2012 ◽

Author(s):

Vijay Nalladega ◽

Shamachary Sathish ◽

Kumar V. ◽

Mark P.

Keyword(s):

Atomic Force Microscopy ◽

Material Property ◽

Force Microscopy ◽

Atomic Force ◽

Multiple Material ◽

Induced Currents ◽

Property Characterization

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Influence of Thickness on Structural and Optical Properties of Titanium Oxide Thin Layers

Scanning Probe Microscopy-Physical Property Characterization at Nanoscale ◽

10.5772/35763 ◽

2012 ◽

Author(s):

Haleh Kangarlou ◽

Saeid Rafizadeh

Keyword(s):

Optical Properties ◽

Titanium Oxide ◽

Thin Layers ◽

Structural And Optical Properties

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Scanning Probe Microscopy-Physical Property Characterization at NanoscaleLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Intech

Elastic and Nanowearing Properties of SiO2-PMMA and Hybrid Coatings Evaluated by Atomic Force Acoustic Microscopy and Nanoindentation"

Characterization of Complex Spintronic and Superconducting Structures by Atomic Force Microscopy Techniques

Polyamide-Imide Membranes of Various Morphology - Features of Nano-Scale Elements of Structure

Tuning Fork Scanning Probe Microscopes - Applications for the Nano-Analysis of the Material Surface and Local Physico-Mechanical Properties

Microtribological Behavior of Polymer-Nanoparticle Thin Film with AFM

Estimation of Grain Boundary Sliding During Ambient-Temperature Creep in Hexagonal Close-Packed Metals Using Atomic Force Microscope

Statistical Analysis in Homopolymeric Surfaces

Nanomechanical Evaluation of Ultrathin Lubricant Films on Magnetic Disks by Atomic Force Microscopy

Multiple Material Property Characterization Using Induced Currents and Atomic Force Microscopy

Influence of Thickness on Structural and Optical Properties of Titanium Oxide Thin Layers

Scanning Probe Microscopy-Physical Property Characterization at Nanoscale
Latest Publications