scholarly journals Multiple Material Property Characterization Using Induced Currents and Atomic Force Microscopy

10.5772/35594 ◽  
2012 ◽  
Author(s):  
Vijay Nalladega ◽  
Shamachary Sathish ◽  
Kumar V. ◽  
Mark P.
Keyword(s):  
Atomic Force Microscopy ◽  
Material Property ◽  
Force Microscopy ◽  
Atomic Force ◽  
Multiple Material ◽  
Induced Currents ◽  
Property Characterization

Exploring Dynamic Non-Idealities in Multi-Frequency Atomic Force Microscopy

2012 ◽  
Author(s):  
Santiago D. Solares
Keyword(s):  
Atomic Force Microscopy ◽  
Material Property ◽  
Mitigation Strategies ◽  
Promising Technique ◽  
Dynamic Complexity ◽  
Force Microscopy ◽  
Process Dynamics ◽  
Atomic Force ◽  
Tapping Mode Afm ◽  
Nanoscale Science

Multi-frequency atomic force microscopy (AFM), in which the microcantilever is driven at more than one frequency, has emerged as a promising technique for simultaneous topographical imaging and material property mapping. While enabling significant advantages over traditional tapping-mode AFM, the greater dynamic complexity of multi-frequency AFM also requires deeper understanding on the part of the user in order to properly interpret the results obtained. This paper illustrates this challenge by exploring a few key dynamic non-idealities, which if neglected could lead to errors of interpretation. These non-ideal phenomena offer a unique opportunity for mechanical engineers to make significant contributions to nanoscale science by providing an increased understanding of the imaging process dynamics and by developing mitigation strategies for dynamics-related artifacts.

Electrostatic Forces on the Surface of Metals as Measured by Atomic Force Microscopy

2000 ◽  
Vol 10 (1-2) ◽  
pp. 15
Author(s):  
Eugene Sprague ◽  
Julio C. Palmaz ◽  
Cristina Simon ◽  
Aaron Watson
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Forces ◽  
Force Microscopy ◽  
Atomic Force
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