Constrained ATPG for functional RTL circuits using F-Scan

2010 IEEE International Test Conference ◽

10.1109/test.2010.5699265 ◽

2010 ◽

Cited By ~ 1

Author(s):

Marie Engelene J. Obien ◽

Satoshi Ohtake ◽

Hideo Fujiwara

Download Full-text