2017 IEEE 26th Asian Test Symposium (ATS)
Latest Publications

TOTAL DOCUMENTS

60

(FIVE YEARS 0)

H-INDEX

5

(FIVE YEARS 0)

Published By IEEE

9781538624371

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Compaction of a Transparent-Scan Sequence to Reduce the Fail Data Volume for Scan Chain Faults

2017 IEEE 26th Asian Test Symposium (ATS) ◽

10.1109/ats.2017.35 ◽

2017 ◽

Author(s):

Irith Pomeranz

Keyword(s):

Data Volume ◽

Scan Chain

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Automotive IC On-line Test Techniques and the Application of Deterministic ATPG-Based Runtime Test

2017 IEEE 26th Asian Test Symposium (ATS) ◽

10.1109/ats.2017.52 ◽

2017 ◽

Cited By ~ 2

Author(s):

Yoichi Maeda ◽

Jun Matsushima ◽

Ron Press

Keyword(s):

On Line ◽

Line Test

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Keynote Addresses [3 abstracts]

2017 IEEE 26th Asian Test Symposium (ATS) ◽

10.1109/ats.2017.11 ◽

2017 ◽

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Design for Testability Technique of Reversible Logic Circuits Based on Exclusive Testing

2017 IEEE 26th Asian Test Symposium (ATS) ◽

10.1109/ats.2017.54 ◽

2017 ◽

Author(s):

Joyati Mondal ◽

Debesh Kumar Das

Keyword(s):

Design For Testability ◽

Logic Circuits ◽

Reversible Logic

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An Incremental Aging Analysis Method Based on Delta Circuit Simulation Technique

2017 IEEE 26th Asian Test Symposium (ATS) ◽

10.1109/ats.2017.24 ◽

2017 ◽

Author(s):

Si-Rong He ◽

Nguyen Cao Qui ◽

Yu-Hsuan Kuo ◽

Chien-Nan Jimmy Liu

Keyword(s):

Circuit Simulation ◽

Simulation Technique ◽

Analysis Method

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Foreword

2017 IEEE 26th Asian Test Symposium (ATS) ◽

10.1109/ats.2017.5 ◽

2017 ◽

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[Publisher's information]

2017 IEEE 26th Asian Test Symposium (ATS) ◽

10.1109/ats.2017.59 ◽

2017 ◽

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Test Compaction with Dynamic Updating of Faults for Coverage of Undetected Transition Fault Sites

2017 IEEE 26th Asian Test Symposium (ATS) ◽

10.1109/ats.2017.19 ◽

2017 ◽

Author(s):

Irith Pomeranz

Keyword(s):

Test Compaction ◽

Transition Fault ◽

Dynamic Updating

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PADLOC: Physically-Aware Defect Localization and Characterization

2017 IEEE 26th Asian Test Symposium (ATS) ◽

10.1109/ats.2017.48 ◽

2017 ◽

Cited By ~ 2

Author(s):

Soumya Mittal ◽

R. D. Blanton

Keyword(s):

Defect Localization

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Invited talk: A foundry’s view of hardware security

2017 IEEE 26th Asian Test Symposium (ATS) ◽

10.1109/ats.2017.12 ◽

2017 ◽

Keyword(s):

Hardware Security

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