2008 14th IEEE International On-Line Testing Symposium
Latest Publications

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Published By IEEE

9780769532646

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

SystemC-Based Minimum Intrusive Fault Injection Technique with Improved Fault Representation

2008 14th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2008.25 ◽

2008 ◽

Cited By ~ 33

Author(s):

Rishad Ahmed Shafik ◽

Paul Rosinger ◽

Bashir M. Al-Hashimi

Keyword(s):

Fault Injection ◽

Injection Technique

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Soft Error Rates of Hardened Sequentials utilizing Local Redundancy

2008 14th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2008.61 ◽

2008 ◽

Cited By ~ 11

Author(s):

Norbert Seifert

Keyword(s):

Error Rates ◽

Soft Error

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Basic Architecture for Logic Self Repair

2008 14th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2008.17 ◽

2008 ◽

Cited By ~ 3

Author(s):

Tobias Koal ◽

Heinrich T. Vierhaus

Keyword(s):

Self Repair

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Growing Interest of Advanced Commercial CMOS Technologies for Space and Medical Applications. Illustration with a New Nano-Power and Radiation-Hardened SRAM in 130nm CMOS

2008 14th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2008.60 ◽

2008 ◽

Cited By ~ 3

Author(s):

Philippe Roche ◽

Mark Lysinger ◽

Gilles Gasiot ◽

Jean-Marc Daveau ◽

Mehdi Zamanian ◽

...

Keyword(s):

Medical Applications ◽

Radiation Hardened

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Directed Random SBST Generation for On-Line Testing of Pipelined Processors

2008 14th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2008.18 ◽

2008 ◽

Cited By ~ 8

Author(s):

A. Merentitis ◽

G. Theodorou ◽

M. Giorgaras ◽

N. Kranitis

Keyword(s):

On Line ◽

Pipelined Processors

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A Systematical Method of Quantifying SEU FIT

2008 14th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2008.62 ◽

2008 ◽

Cited By ~ 11

Author(s):

Shi-Jie Wen ◽

Dan Alexandrescu ◽

Renaud Perez

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Propagation of Transients Along Sensitizable Paths

2008 14th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2008.46 ◽

2008 ◽

Cited By ~ 3

Author(s):

Sreenivas Gangadhar ◽

Michael Skoufis ◽

Spyros Tragoudas

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Physical Demonstration of Polymorphic Self-Checking Circuits

2008 14th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2008.23 ◽

2008 ◽

Cited By ~ 20

Author(s):

Richard Ruzicka ◽

Lukas Sekanina ◽

Roman Prokop

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On the Evaluation of Radiation-Induced Transient Faults in Flash-Based FPGAs

2008 14th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2008.47 ◽

2008 ◽

Cited By ~ 12

Author(s):

Niccolò Battezzati ◽

Simone Gerardin ◽

Andrea Manuzzato ◽

Alessandro Paccagnella ◽

Sana Rezgui ◽

...

Keyword(s):

Transient Faults ◽

Radiation Induced

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A Hybrid Approach to the Test of Cache Memory Controllers Embedded in SoCs

2008 14th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2008.22 ◽

2008 ◽

Cited By ~ 18

Author(s):

W.J. Perez ◽

J. Velasco ◽

D. Ravotto ◽

E. Sanchez ◽

M. Sonza Reorda

Keyword(s):

Hybrid Approach ◽

Cache Memory

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2008 14th IEEE International On-Line Testing SymposiumLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

SystemC-Based Minimum Intrusive Fault Injection Technique with Improved Fault Representation

Soft Error Rates of Hardened Sequentials utilizing Local Redundancy

Basic Architecture for Logic Self Repair

Growing Interest of Advanced Commercial CMOS Technologies for Space and Medical Applications. Illustration with a New Nano-Power and Radiation-Hardened SRAM in 130nm CMOS

Directed Random SBST Generation for On-Line Testing of Pipelined Processors

A Systematical Method of Quantifying SEU FIT

Propagation of Transients Along Sensitizable Paths

Physical Demonstration of Polymorphic Self-Checking Circuits

On the Evaluation of Radiation-Induced Transient Faults in Flash-Based FPGAs

A Hybrid Approach to the Test of Cache Memory Controllers Embedded in SoCs

2008 14th IEEE International On-Line Testing Symposium
Latest Publications