Image Sensing Technologies: Materials, Devices, Systems, and Applications V
Latest Publications

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Published By SPIE

9781510618237, 9781510618244

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Front Matter: Volume 10656

Image Sensing Technologies: Materials, Devices, Systems, and Applications V ◽

10.1117/12.2502367 ◽

2018 ◽

Keyword(s):

Matter Volume

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Achieving fast high-resolution 3D imaging by combining synchrotron x-ray microCT, advanced algorithms, and high performance data management

Image Sensing Technologies: Materials, Devices, Systems, and Applications V ◽

10.1117/12.2307272 ◽

2018 ◽

Author(s):

Dilworth Y. Parkinson ◽

James Sethian ◽

Joseph Pacold ◽

Miela Gross ◽

Tristan Mcdougall ◽

...

Keyword(s):

High Resolution ◽

Data Management ◽

High Performance ◽

3D Imaging ◽

Performance Data ◽

X Ray

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EUV photolithography mask inspection using Fourier ptychography

Image Sensing Technologies: Materials, Devices, Systems, and Applications V ◽

10.1117/12.2307860 ◽

2018 ◽

Cited By ~ 1

Author(s):

Antoine Wojdyla ◽

Markus P. Benk ◽

Patrick P. Naulleau ◽

Kenneth A. Goldberg

Keyword(s):

Mask Inspection

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Explosive hazard defeat challenges and needs in future conflict and environment

Image Sensing Technologies: Materials, Devices, Systems, and Applications V ◽

10.1117/12.2306003 ◽

2018 ◽

Author(s):

Joong H. Kim

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Analytical model for design-optimization and performances of fabricated broadband (VIS-SWIR) photodetector for image sensor and optical communication applications

Image Sensing Technologies: Materials, Devices, Systems, and Applications V ◽

10.1117/12.2311596 ◽

2018 ◽

Author(s):

Jaydeep Dutta ◽

Patrick Oduor ◽

Achyut K. Dutta ◽

Nibir K. Dhar

Keyword(s):

Design Optimization ◽

Analytical Model ◽

Optical Communication ◽

Image Sensor

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Non-destructive rapid quality control method for tobacco grading using visible near-infrared hyperspectral imaging

Image Sensing Technologies: Materials, Devices, Systems, and Applications V ◽

10.1117/12.2305091 ◽

2018 ◽

Author(s):

Henry Dante ◽

Amrita Sahu

Keyword(s):

Quality Control ◽

Hyperspectral Imaging ◽

Near Infrared ◽

Control Method ◽

Quality Control Method ◽

Non Destructive

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High resolution 3D imaging of integrated circuits by x-ray ptychography

Image Sensing Technologies: Materials, Devices, Systems, and Applications V ◽

10.1117/12.2304835 ◽

2018 ◽

Cited By ~ 1

Author(s):

Michal Odstrcil ◽

Mirko Holler ◽

Jörg Raabe ◽

Manuel Guizar-Sicairos

Keyword(s):

High Resolution ◽

Integrated Circuits ◽

3D Imaging ◽

X Ray

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Material considerations for current and next generation microbolometer technology

Image Sensing Technologies: Materials, Devices, Systems, and Applications V ◽

10.1117/12.2303728 ◽

2018 ◽

Cited By ~ 1

Author(s):

Athanasios J. Syllaios ◽

Brianna J. Western ◽

Vincent C. Lopes ◽

Christopher L. Littler ◽

Michael S. Harcrow ◽

...

Keyword(s):

Next Generation

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Surface plasmon polariton mode validation using commercially available finite element method ANSYS HFSS

Image Sensing Technologies: Materials, Devices, Systems, and Applications V ◽

10.1117/12.2304424 ◽

2018 ◽

Author(s):

Olanrewaju Olaogun ◽

Michael F. Finch ◽

Brian A. Lail

Keyword(s):

Finite Element Method ◽

Finite Element ◽

Surface Plasmon ◽

Surface Plasmon Polariton ◽

Surface Plasmon Polariton Mode ◽

Plasmon Polariton ◽

Element Method

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Finite size narrow-band transmission filters for real-time short wave IR spectroscopy and imaging

Image Sensing Technologies: Materials, Devices, Systems, and Applications V ◽

10.1117/12.2304665 ◽

2018 ◽

Author(s):

Vitaliy Avrutin ◽

Ümit Özgür ◽

Erdem Topsakal ◽

Ryan Green ◽

Nibir K. Dhar

Keyword(s):

Ir Spectroscopy ◽

Real Time ◽

Narrow Band ◽

Finite Size ◽

Short Wave ◽

Transmission Filters

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Image Sensing Technologies: Materials, Devices, Systems, and Applications VLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By SPIE

Front Matter: Volume 10656

Achieving fast high-resolution 3D imaging by combining synchrotron x-ray microCT, advanced algorithms, and high performance data management

EUV photolithography mask inspection using Fourier ptychography

Explosive hazard defeat challenges and needs in future conflict and environment

Analytical model for design-optimization and performances of fabricated broadband (VIS-SWIR) photodetector for image sensor and optical communication applications

Non-destructive rapid quality control method for tobacco grading using visible near-infrared hyperspectral imaging

High resolution 3D imaging of integrated circuits by x-ray ptychography

Material considerations for current and next generation microbolometer technology

Surface plasmon polariton mode validation using commercially available finite element method ANSYS HFSS

Finite size narrow-band transmission filters for real-time short wave IR spectroscopy and imaging

Image Sensing Technologies: Materials, Devices, Systems, and Applications V
Latest Publications