Records of the IEEE International Workshop on Memory Technology, Design and Testing
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Failure mechanisms in semiconductor memory circuits

Records of the IEEE International Workshop on Memory Technology, Design and Testing ◽

10.1109/mtdt.2000.868609 ◽

2002 ◽

Cited By ~ 2

Author(s):

R. Haythornthwaite

Keyword(s):

Failure Mechanisms ◽

Semiconductor Memory ◽

Memory Circuits

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A low voltage embedded single port SRAM generator in a 0.18 μm standard CMOS process

Records of the IEEE International Workshop on Memory Technology, Design and Testing ◽

10.1109/mtdt.2000.868623 ◽

2002 ◽

Author(s):

C. Frey ◽

F. Genevaux ◽

C. Issartel ◽

D. Turgis ◽

J.P. Schoellkopf

Keyword(s):

Low Voltage ◽

Single Port ◽

Cmos Process ◽

Standard Cmos Process

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Fast voltage regulator for multilevel flash memories

Records of the IEEE International Workshop on Memory Technology, Design and Testing ◽

10.1109/mtdt.2000.868613 ◽

2002 ◽

Cited By ~ 4

Author(s):

O. Khouri ◽

R. Micheloni ◽

S. Gregori ◽

G. Torelli

Keyword(s):

Voltage Regulator ◽

Flash Memories

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Windowed MRAM sensing scheme

Records of the IEEE International Workshop on Memory Technology, Design and Testing ◽

10.1109/mtdt.2000.868615 ◽

2002 ◽

Cited By ~ 1

Author(s):

R. Zhang ◽

W.C. Black ◽

M.M. Hassoun

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66 MHz 2.3 M ternary dynamic content addressable memory

Records of the IEEE International Workshop on Memory Technology, Design and Testing ◽

10.1109/mtdt.2000.868622 ◽

2002 ◽

Cited By ~ 20

Author(s):

V. Lines ◽

A. Ahmed ◽

P. Ma ◽

S. Ma ◽

R. McKenzie ◽

...

Keyword(s):

Content Addressable Memory ◽

Dynamic Content

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Hierarchical sector biasing organization for flash memories

Records of the IEEE International Workshop on Memory Technology, Design and Testing ◽

10.1109/mtdt.2000.868612 ◽

2002 ◽

Cited By ~ 5

Author(s):

R. Micheloni ◽

M. Zammattio ◽

G. Campardo ◽

O. Khouri ◽

G. Torelli

Keyword(s):

Flash Memories

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Defect analysis and realistic fault model extensions for static random access memories

Records of the IEEE International Workshop on Memory Technology, Design and Testing ◽

10.1109/mtdt.2000.868625 ◽

2002 ◽

Cited By ~ 8

Author(s):

K. Zarrineh ◽

A.P. Deo ◽

R.D. Adams

Keyword(s):

Random Access ◽

Fault Model ◽

Defect Analysis ◽

Static Random Access Memories

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Design techniques for embedded EEPROM memories in portable ASIC and ASSP solutions

Records of the IEEE International Workshop on Memory Technology, Design and Testing ◽

10.1109/mtdt.2000.868614 ◽

2002 ◽

Cited By ~ 4

Author(s):

J.M. Daga ◽

C. Papaix ◽

M. Merandat ◽

S. Ricard ◽

G. Medulla ◽

...

Keyword(s):

Design Techniques

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Diagnostic testing of embedded memories based on output tracing

Records of the IEEE International Workshop on Memory Technology, Design and Testing ◽

10.1109/mtdt.2000.868624 ◽

2002 ◽

Cited By ~ 15

Author(s):

D. Niggemeyer ◽

M. Redeker ◽

E.M. Rudnick

Keyword(s):

Diagnostic Testing ◽

Embedded Memories

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Yield analysis methodology for low defectivity wafer fabs

Records of the IEEE International Workshop on Memory Technology, Design and Testing ◽

10.1109/mtdt.2000.868617 ◽

2002 ◽

Cited By ~ 3

Author(s):

K. Rajkanan

Keyword(s):

Yield Analysis ◽

Analysis Methodology

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Records of the IEEE International Workshop on Memory Technology, Design and TestingLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Failure mechanisms in semiconductor memory circuits

A low voltage embedded single port SRAM generator in a 0.18 μm standard CMOS process

Fast voltage regulator for multilevel flash memories

Windowed MRAM sensing scheme

66 MHz 2.3 M ternary dynamic content addressable memory

Hierarchical sector biasing organization for flash memories

Defect analysis and realistic fault model extensions for static random access memories

Design techniques for embedded EEPROM memories in portable ASIC and ASSP solutions

Diagnostic testing of embedded memories based on output tracing

Yield analysis methodology for low defectivity wafer fabs

Records of the IEEE International Workshop on Memory Technology, Design and Testing
Latest Publications