[Reliability of Compound Semiconductors] ROCS Workshop 2006
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Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

GaN-On-Si Reliability: A Comparative Study Between Process Platforms

2006 ◽  
Author(s):  
S. Singhal ◽  
A. Chaudhari ◽  
A.W. Hanson ◽  
J.W. Johnson ◽  
R. Therrien ◽  
...  
Keyword(s):  
Comparative Study ◽  
Gan On Si

The Effect of Gate Current on the Degradation of GaAs PHEMT MMICs

2006 ◽  
Author(s):  
Y. C. Chou ◽  
P. Chin ◽  
M. Wojtowicz ◽  
T. Block ◽  
A. Oki ◽  
...  
Keyword(s):  
Gate Current

Complete Qualification of an Electron Beam Gate PHEMT Process

2006 ◽  
Author(s):  
Hei-ruey Jen ◽  
Carlos Gil ◽  
Peter Ersland ◽  
Shiou Grace Chu
Keyword(s):  
Electron Beam
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