A Simple, Small-Sized Protection Diode Design to Aimprove ESD Survivability on 2μ¿m Ingap HBT Devices

[Reliability of Compound Semiconductors] ROCS Workshop 2006 ◽

10.1109/rocs.2006.323412 ◽

2006 ◽

Author(s):

H.C. Chou ◽

F. Chou ◽

C.J. Chen ◽

S.C. Chen ◽

C.S. Wu

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