European Test Symposium (ETS'05)
Latest Publications

TOTAL DOCUMENTS

45

(FIVE YEARS 0)

H-INDEX

11

(FIVE YEARS 0)

Published By IEEE Comput. Soc

0769523412

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

The Anatomy of Nanometer Timing Failures

European Test Symposium (ETS'05) ◽

10.1109/ets.2005.42 ◽

2005 ◽

Author(s):

C. Hawkins ◽

J. Segura

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Design Validation of Behavioral VHDL Descriptions for Arbitrary Fault Models

European Test Symposium (ETS'05) ◽

10.1109/ets.2005.14 ◽

2005 ◽

Cited By ~ 1

Author(s):

Fei Xin ◽

M. Ciesielski ◽

I.G. Harris

Keyword(s):

Fault Models ◽

Design Validation

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Bias Superposition — An On-Line Test Strategy for a MEMS Based Conductivity Sensor

European Test Symposium (ETS'05) ◽

10.1109/ets.2005.9 ◽

2005 ◽

Cited By ~ 2

Author(s):

C. Jeffrey ◽

Zhou Xu ◽

A. Richardson

Keyword(s):

Test Strategy ◽

Conductivity Sensor ◽

On Line ◽

Line Test

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Logic Circuits Testing for Transient Faults

European Test Symposium (ETS'05) ◽

10.1109/ets.2005.27 ◽

2005 ◽

Cited By ~ 16

Author(s):

S. Krishnaswamy ◽

I.L. Markov ◽

J.P. Hayes

Keyword(s):

Logic Circuits ◽

Transient Faults

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Resistive-Open Defect Influence in SRAM Pre-Charge Circuits: Analysis and Characterization

European Test Symposium (ETS'05) ◽

10.1109/ets.2005.33 ◽

2005 ◽

Cited By ~ 13

Author(s):

L. Dilillo ◽

P. Girard ◽

S. Pravossoudovitch ◽

A. Virazel

Keyword(s):

Open Defect

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Evaluation of Impulse Response-Based BIST Techniques for MEMS in the Presence of Weak Nonlinearities

European Test Symposium (ETS'05) ◽

10.1109/ets.2005.21 ◽

2005 ◽

Cited By ~ 2

Author(s):

A. Dhayni ◽

S. Mir ◽

L. Rufer

Keyword(s):

Impulse Response

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A Novel Delay Fault Testing Methodology Using On-Chip Low-Overhead Delay Measurement Hardware at Strategic Probe Points

European Test Symposium (ETS'05) ◽

10.1109/ets.2005.2 ◽

2005 ◽

Cited By ~ 5

Author(s):

A. Raychowdhury ◽

S. Ghosh ◽

S. Bhunia ◽

D. Ghosh ◽

K. Roy

Keyword(s):

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing ◽

Testing Methodology ◽

Delay Measurement ◽

On Chip

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Evaluation of Signature-Based Testing of RF/Analog Circuits

European Test Symposium (ETS'05) ◽

10.1109/ets.2005.22 ◽

2005 ◽

Cited By ~ 9

Author(s):

A. Zjajo ◽

J. Pineda de Gyvez

Keyword(s):

Analog Circuits

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Convolutional Compaction-Driven Diagnosis of Scan Failures

European Test Symposium (ETS'05) ◽

10.1109/ets.2005.11 ◽

2005 ◽

Cited By ~ 2

Author(s):

G. Mrugalski ◽

A. Pogiel ◽

J. Rajski ◽

J. Tyszer ◽

Chen Wang

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Test Control for Secure Scan Designs

European Test Symposium (ETS'05) ◽

10.1109/ets.2005.36 ◽

2005 ◽

Cited By ~ 45

Author(s):

D. Hely ◽

F. Bancel ◽

M. Flottes ◽

B. Rouzeyre

Keyword(s):

Test Control

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