Materials and Electron Device Processing
Latest Publications

TOTAL DOCUMENTS

32

(FIVE YEARS 0)

H-INDEX

2

(FIVE YEARS 0)

Published By ASTM International

9780803161177

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Effects of Various Cleaning Methods on Electronic Components in the Micromodule

Materials and Electron Device Processing ◽

10.1520/stp41246s ◽

2009 ◽

pp. 254-254-7

Author(s):

J. L. Vossen

Keyword(s):

Electronic Components ◽

Cleaning Methods

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Comparison of Standard Leak Rates Measured by Viscous and Molecular Flow Techniques

Materials and Electron Device Processing ◽

10.1520/stp41239s ◽

2009 ◽

pp. 187-187-6

Author(s):

D. W. Maurer

Keyword(s):

Molecular Flow ◽

Flow Techniques

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Recommended Practices for Safe Handling of Beryllium Oxide Ceramics

Materials and Electron Device Processing ◽

10.1520/stp41234s ◽

2009 ◽

pp. 145-145-11

Author(s):

Laurence E. Ferreira

Keyword(s):

Beryllium Oxide ◽

Oxide Ceramics ◽

Safe Handling ◽

Recommended Practices

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ARC Sealing of Borosilicate Glasses

Materials and Electron Device Processing ◽

10.1520/stp41233s ◽

2009 ◽

pp. 137-137-5

Author(s):

Morris Liebson

Keyword(s):

Borosilicate Glasses

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Transducer Parameters Affecting Sonic Cleaning

Materials and Electron Device Processing ◽

10.1520/stp41230s ◽

2009 ◽

pp. 113-113-10

Author(s):

L. J. Lyons

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Elimination of Contaminants from Electron Tube Components: Automation of Chemical Processing

Materials and Electron Device Processing ◽

10.1520/stp41229s ◽

2009 ◽

pp. 101-101-12

Author(s):

C. O. Thomas ◽

W. H. Craft ◽

D. E. Koontz

Keyword(s):

Chemical Processing ◽

Electron Tube

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Gas-Phase Proportional Counting: A Radiotracer Technique for Examination of Electronic Components and Materials

Materials and Electron Device Processing ◽

10.1520/stp41227s ◽

2009 ◽

pp. 82-82-9

Author(s):

Herman A. Stern

Keyword(s):

Gas Phase ◽

Electronic Components ◽

Radiotracer Technique

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Detection of Inorganic Contamination on Surfaces by an EMF Measurement

Materials and Electron Device Processing ◽

10.1520/stp41223s ◽

2009 ◽

pp. 46-46-7 ◽

Cited By ~ 3

Author(s):

D. G. Schimmel

Keyword(s):

Inorganic Contamination

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Sulfamic Acid Cleaning of Electron Tube Parts

Materials and Electron Device Processing ◽

10.1520/stp41236s ◽

2009 ◽

pp. 162-162-4

Author(s):

Robert W. Etter

Keyword(s):

Sulfamic Acid ◽

Electron Tube ◽

Acid Cleaning

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Noise-Tested Cathode Activation

Materials and Electron Device Processing ◽

10.1520/stp41247s ◽

2009 ◽

pp. 261-261-15

Author(s):

F. Dlouhy ◽

H. J. Schuetze

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