Detection of Inorganic Contamination on Surfaces by an EMF Measurement

2009 ◽  
pp. 46-46-7 ◽  
Author(s):  
D. G. Schimmel
Keyword(s):  
Inorganic Contamination

Organic and inorganic contamination in sediments from Araçá Bay, São Sebastião, Brazil

2018 ◽  
Vol 164 ◽  
pp. 42-51 ◽  
Author(s):  
Bianca Sung Mi Kim ◽  
Márcia Caruso Bícego ◽  
Satie Taniguchi ◽  
Eduardo Siegle ◽  
Renato Oliveira ◽  
...  
Keyword(s):  
Inorganic Contamination

F-66 Investigation of Spin-Coated Inorganic Contamination on Si Surfaces by Various Analytical Techniques

2010 ◽  
Vol 25 (2) ◽  
pp. 215-215
Author(s):  
B. Beckhoff ◽  
M. Kolbe ◽  
M. Müller ◽  
A. Nutsch ◽  
R. Altmann ◽  
...  
Keyword(s):  
Analytical Techniques ◽  
Inorganic Contamination

Enrichment diagram (ED)

2014 ◽  
Vol 25 (4) ◽  
pp. 467-479 ◽  
Author(s):  
Andreza Portella Ribeiro ◽  
Ana Maria Graciano Figueiredo ◽  
José Osman dos Santos ◽  
Elizabeth Sonoda Keiko Dantas ◽  
Marycel Elena Barboza Cotrim ◽  
...  
Keyword(s):  
Urban Area ◽  
Design Methodology ◽  
Optical Emission ◽  
Enrichment Factors ◽  
Sepetiba Bay ◽  
Content Type ◽  
Background Sample ◽  
Inorganic Contamination

Purpose – The purpose of this paper is to validate and apply enrichment diagrams (EDs) to determine metal and as enrichment and contamination in the sediments of Sepetiba Bay. Design/methodology/approach – Through inducted coupled plasma – optical emission spectrophotometry, total element (As, Cd, Cu, Ni, Pb and Zn) concentrations were assessed for the construction of EDs and comparison with enrichment factors (EFs) in 65 samples collected in Sepetiba Bay. Findings – Based on the EDs, it was observed that the sediments around the urban area of Sepetiba and ItaguaíHarbor were contaminated with Cd, Cu, Ni, Pb and Zn. These contaminants were expected due to the urban and industrial discharges into the bay and the activities at ItaguaíHarbor. Originality/value – The ED was successful regarding its ability to evaluate inorganic contamination in Sepetiba Bay. In addition, this method was able to define a proper background sample for calculating EFs.

Characterization Of Inorganic Contamination In Liquid Crystal Display Materials Using Total Reflection X-Ray Fluorescence (TXRF)

1994 ◽  
Vol 345 ◽  
Author(s):  
R. S. Hockett ◽  
J. M. Metz
Keyword(s):  
Liquid Crystal ◽  
Liquid Crystal Display ◽  
Total Reflection ◽  
Depth Information ◽  
Inorganic Elements ◽  
X Ray ◽  
Glass Substrates ◽  
Glancing Angle ◽  
Inorganic Contamination

AbstractThis work is a feasibility study for using Total reflection X-Ray Fluorescence (TXRF) to characterize inorganic contamination at the surface of, and in, liquid crystal display materials as a function of their processing. Five samples were taken from process steps called: Cr black mask, Cr pattern, RGB pattern, topcoat, and ITO, all on glass substrates. TXRF, a glancing angle XRF technique, is sensitive to inorganic elements and can be used to detect inorganic contamination at surfaces. In addition, increasing the glancing angle can lead to penetration of thin films, and thereby to some qualitative depth information for the detected elements. Elements detected in this study included: Al, Si, S, Cl, In/Sn, Ca, Ba, Cr, Fe, Cu, Ni and Zn.

Reliable Quantification of Inorganic Contamination by TXRF

2012 ◽  
Vol 187 ◽  
pp. 291-294 ◽  
Author(s):  
Matthias Müller ◽  
Andreas Nutsch ◽  
Roswitha Altmann ◽  
Gabriella Borionetti ◽  
T. Holz ◽  
...  
Keyword(s):  
Analytical Techniques ◽  
Total Reflection ◽  
Inorganic Contaminants ◽  
X Ray ◽  
Low Concentration ◽  
Novel Materials ◽  
Inorganic Contamination ◽  
Reliable Quantification ◽  
Further Development

The European Integrated Activity of Excellence and Networking for nanoand Micro-Electronics Analysis (ANNA), www.ANNA-i3.net, has addressed the further development and assessment of methodologies for the detection of low concentration inorganic contaminants on and in silicon as well as for novel materials. The comparison of various analytical techniques available to the ANNA partners helped to identify the degree of comparableness of results revealed at different installations. The assessment of improved methodologies as well as the reliability of quantification and calibration procedures of specific analytical techniques such as Total-Reflection X-ray Fluorescence (TXRF) analysis has been of particular interest.

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