Surface Coating of Cyclotetramethylenetetranitramine (HMX) Particles and Its Property Investigation

To improve the safety of cyclotetramethylenetetranitramine (HMX) particles, the polymer thermoplastic polyurethane elastomer (TPU) and nitrocellulose (NC) were introduced to coat HMX powder by water-solution suspension method and internal solution method, respectively. Scanning electron microscope (SEM) and X-ray photo-electron spectrometry (XPS) were employed to characterize the HMX samples and the role of NC and TPU in the coating processes were discussed. The impact sensitivity, friction sensitivity, and the thermal decomposition of coated HMX particles were investigated, and compared to the unprocessed ones. The results indicate that both TPU and NC can improve the wetting ability of the coating materials on HMX surface and reinforce the connection between HMX and the coating materials. The impact sensitivity and friction sensitivity of HMX samples decrease obviously after they have been surface coated; the drop height (H50) is increased from 35.24 cm to 50.08 cm, and the friction probability is reduced from 93.2 % to 58.3%. The activation energy (Ea) and the self-ignition temperature increase by 10.46 KJ·mol-1 and 1.8, respectively.

Electron spectrometry with Silicon drift detectors: a GEANT4 based method for detector response reconstruction

Precision electron spectrometry in the keV range has always been considered a challenging task. The reconstruction of the original electron energy from the detected signal is not trivial because multiple effects modify the kinetic energy of the electron along its path. If not correctly accounted for, these effects can spoil and bias the reconstructed energy with a dramatic reduction of accuracy and precision. In this paper we address one of the most critical aspects of electron spectrometry: the generally unknown effect of the detector entrance window. We show that, with a MonteCarlo-based approach, we are able to build a model of the entrance window accurate enough to reduce the negative effects due to its existence. We adopt for this purpose Silicon Drift Detectors that, thought primarily used for X-ray spectrometry, appear a promising device for electron spectrometry. The technique we discuss exploits characterization and validation measurements performed with electron beams from a Scanning Electron Microscope, later reconstructed with a GEANT4 MonteCarlo simulation.

Oxidition Resistance of Multi-Arc Ion Plating TiN Films

Depositing TiN Film on the surface of 4Cr5MoSiV1 with multi-arc ion plating technology method. And 350°C, 450°C, 550°C and 650 °C short oxidation test and 550 °C cyclic oxidation test. By scanning electron microscopy (SEM) and electron spectrometry (EDS) to analysis micro-structure and phase structure of test samples, study TiN film on oxidation resistance, and utilize indentation method to measure mechanical properties. Results show: In a short time under oxidizing conditions, at 550 °C the TiN film still has a good oxidation resistance. The film still have a sufficient bonding strength below 600 °C.