inductive fault analysis Latest Research Papers

Digital CMOS Fault Modeling and Inductive Fault Analysis

Integrated Circuit Manufacturability ◽

10.1109/9780470544921.ch3 ◽

2009 ◽

Keyword(s):

Fault Modeling ◽

Fault Analysis ◽

Digital Cmos ◽

Inductive Fault Analysis

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Inductive Fault Analysis for Test and Diagnosis of DNA Sensor Arrays

8th International Symposium on Quality Electronic Design (ISQED'07) ◽

10.1109/isqed.2007.90 ◽

2007 ◽

Author(s):

Daniela De Venuto ◽

Bruno Ricco

Keyword(s):

Sensor Arrays ◽

Fault Analysis ◽

Dna Sensor ◽

Inductive Fault Analysis

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Inductive fault analysis of surface-micromachined MEMS

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2005.855926 ◽

2006 ◽

Vol 25 (6) ◽

pp. 1104-1116 ◽

Cited By ~ 6

Author(s):

Tao Jiang ◽

R.D. Blanton

Keyword(s):

Fault Analysis ◽

Inductive Fault Analysis

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Exploiting Regularity for Inductive Fault Analysis

24th IEEE VLSI Test Symposium ◽

10.1109/vts.2006.35 ◽

2006 ◽

Author(s):

J.G. Brown ◽

R.D.S. Blanton

Keyword(s):

Fault Analysis ◽

Inductive Fault Analysis

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Extraction and simulation of realistic CMOS faults using inductive fault analysis

International Test Conference 1988 Proceeding@m_New Frontiers in Testing ◽

10.1109/test.1988.207759 ◽

2003 ◽

Cited By ~ 177

Author(s):

F.J. Ferguson ◽

J.P. Shen

Keyword(s):

Fault Analysis ◽

Inductive Fault Analysis

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Carafe: an inductive fault analysis tool for CMOS VLSI circuits

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium ◽

10.1109/vtest.1993.313302 ◽

2002 ◽

Cited By ~ 114

Author(s):

A. Jee ◽

F.J. Ferguson

Keyword(s):

Fault Analysis ◽

Vlsi Circuits ◽

Analysis Tool ◽

Inductive Fault Analysis ◽

Cmos Vlsi

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Cache RAM inductive fault analysis with fab defect modeling

Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) ◽

10.1109/test.1998.743275 ◽

2002 ◽

Cited By ~ 18

Author(s):

T.M. Mak ◽

D. Bhattacharya ◽

C. Prunty ◽

B. Roeder ◽

N. Ramadan ◽

...

Keyword(s):

Fault Analysis ◽

Defect Modeling ◽

Inductive Fault Analysis

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Extension of inductive fault analysis to parametric faults in analog circuits with application to test generation

Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) ◽

10.1109/vtest.1997.600249 ◽

2002 ◽

Cited By ~ 8

Author(s):

Z. Jaworski ◽

M. Niewczas ◽

W. Kuzmicz

Keyword(s):

Analog Circuits ◽

Test Generation ◽

Fault Analysis ◽

Parametric Faults ◽

Inductive Fault Analysis

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Rapid inductive fault analysis for high-yield circuits

Microelectronics Journal ◽

10.1016/s0026-2692(01)00138-0 ◽

2002 ◽

Vol 33 (3) ◽

pp. 279-284 ◽

Cited By ~ 1

Author(s):

A Platts ◽

D Taylor

Keyword(s):

Fault Analysis ◽

High Yield ◽

Inductive Fault Analysis

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Digital CMOS Fault Modeling and Inductive Fault Analysis

Defect Oriented Testing for CMOS Analog and Digital Circuits - Frontiers in Electronic Testing ◽

10.1007/978-1-4757-4926-7_2 ◽

1999 ◽

pp. 15-63

Author(s):

Manoj Sachdev

Keyword(s):

Fault Modeling ◽

Fault Analysis ◽

Digital Cmos ◽

Inductive Fault Analysis

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inductive fault analysis
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TOTAL DOCUMENTS

H-INDEX

Digital CMOS Fault Modeling and Inductive Fault Analysis

Inductive Fault Analysis for Test and Diagnosis of DNA Sensor Arrays

Inductive fault analysis of surface-micromachined MEMS

Exploiting Regularity for Inductive Fault Analysis

Extraction and simulation of realistic CMOS faults using inductive fault analysis

Carafe: an inductive fault analysis tool for CMOS VLSI circuits

Cache RAM inductive fault analysis with fab defect modeling

Extension of inductive fault analysis to parametric faults in analog circuits with application to test generation

Rapid inductive fault analysis for high-yield circuits

Digital CMOS Fault Modeling and Inductive Fault Analysis

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inductive fault analysisRecently Published Documents

TOTAL DOCUMENTS

H-INDEX

Digital CMOS Fault Modeling and Inductive Fault Analysis

Inductive Fault Analysis for Test and Diagnosis of DNA Sensor Arrays

Inductive fault analysis of surface-micromachined MEMS

Exploiting Regularity for Inductive Fault Analysis

Extraction and simulation of realistic CMOS faults using inductive fault analysis

Carafe: an inductive fault analysis tool for CMOS VLSI circuits

Cache RAM inductive fault analysis with fab defect modeling

Extension of inductive fault analysis to parametric faults in analog circuits with application to test generation

Rapid inductive fault analysis for high-yield circuits

Digital CMOS Fault Modeling and Inductive Fault Analysis

inductive fault analysis
Recently Published Documents