Nanoscale bending movement of biological micro-object induced by femtosecond laser impulse and its detection by atomic force microscopy

2014 ◽  
Vol 7 (8) ◽  
pp. 087002 ◽  
Author(s):  
Masanobu Takenaka ◽  
Takanori Iino ◽  
Akira Nagatani ◽  
Yoichiroh Hosokawa
Keyword(s):  
Atomic Force Microscopy ◽  
Femtosecond Laser ◽  
Force Microscopy ◽  
Atomic Force ◽  
Laser Impulse

scholarly journals Noncontact estimation of intercellular breaking force using a femtosecond laser impulse quantified by atomic force microscopy

2011 ◽  
Vol 108 (5) ◽  
pp. 1777-1782 ◽  
Author(s):  
Yoichiroh Hosokawa ◽  
Man Hagiyama ◽  
Takanori Iino ◽  
Yoshinori Murakami ◽  
Akihiko Ito
Keyword(s):  
Atomic Force Microscopy ◽  
Femtosecond Laser ◽  
Breaking Force ◽  
Force Microscopy ◽  
Atomic Force ◽  
Laser Impulse

scholarly journals Особенности наноструктурирования поверхности кремния в результате ее сверхбыстрого нагрева фемтосекундным лазерным импульсом в воде

2018 ◽  
Vol 44 (14) ◽  
pp. 58
Author(s):  
С.А. Ромашевский
Keyword(s):  
Atomic Force Microscopy ◽  
Laser Pulse ◽  
Femtosecond Laser ◽  
Surface Morphology ◽  
Silicon Surface ◽  
Ablation Threshold ◽  
Water Environment ◽  
Force Microscopy ◽  
Atomic Force ◽  
Minimum Depth

AbstractSilicon surface morphology induced by a femtosecond laser pulse at near-threshold fluences in water environment is investigated by means of atomic-force microscopy (AFM). With increasing fluence, the silicon surface transforms into nanoscale ring-shaped and blister structures, as well as smooth and nanostructured microcraters with a minimum depth of 1 nm. The formation of starlike patterns imprinted at the surface of microcraters at fluences above the ablation threshold is observed.

Imaging Dielectric Properties of Si Nanowire Oxide with Conductive Atomic Force Microscopy Complemented with Femtosecond Laser Illumination

Nano Letters ◽  
2008 ◽  
Vol 8 (7) ◽  
pp. 1949-1953 ◽  
Author(s):  
Emmanuel Stratakis ◽  
Nipun Misra ◽  
Emmanuel Spanakis ◽  
David J. Hwang ◽  
Costas P. Grigoropoulos ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Dielectric Properties ◽  
Femtosecond Laser ◽  
Conductive Atomic Force Microscopy ◽  
Laser Illumination ◽  
Force Microscopy ◽  
Si Nanowire ◽  
Atomic Force
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