Electron and atomic force microscopy studies of femtosecond laser machining of Si, GaAs and InP

2001 ◽  
Author(s):  
A. Borowiec ◽  
M. MacKenzie ◽  
G.C. Weatherly ◽  
H.K. Haugen
Keyword(s):  
Atomic Force Microscopy ◽  
Femtosecond Laser ◽  
Laser Machining ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Особенности наноструктурирования поверхности кремния в результате ее сверхбыстрого нагрева фемтосекундным лазерным импульсом в воде

2018 ◽  
Vol 44 (14) ◽  
pp. 58
Author(s):  
С.А. Ромашевский
Keyword(s):  
Atomic Force Microscopy ◽  
Laser Pulse ◽  
Femtosecond Laser ◽  
Surface Morphology ◽  
Silicon Surface ◽  
Ablation Threshold ◽  
Water Environment ◽  
Force Microscopy ◽  
Atomic Force ◽  
Minimum Depth

AbstractSilicon surface morphology induced by a femtosecond laser pulse at near-threshold fluences in water environment is investigated by means of atomic-force microscopy (AFM). With increasing fluence, the silicon surface transforms into nanoscale ring-shaped and blister structures, as well as smooth and nanostructured microcraters with a minimum depth of 1 nm. The formation of starlike patterns imprinted at the surface of microcraters at fluences above the ablation threshold is observed.

Imaging Dielectric Properties of Si Nanowire Oxide with Conductive Atomic Force Microscopy Complemented with Femtosecond Laser Illumination

Nano Letters ◽  
2008 ◽  
Vol 8 (7) ◽  
pp. 1949-1953 ◽  
Author(s):  
Emmanuel Stratakis ◽  
Nipun Misra ◽  
Emmanuel Spanakis ◽  
David J. Hwang ◽  
Costas P. Grigoropoulos ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Dielectric Properties ◽  
Femtosecond Laser ◽  
Conductive Atomic Force Microscopy ◽  
Laser Illumination ◽  
Force Microscopy ◽  
Si Nanowire ◽  
Atomic Force

scholarly journals Noncontact estimation of intercellular breaking force using a femtosecond laser impulse quantified by atomic force microscopy

2011 ◽  
Vol 108 (5) ◽  
pp. 1777-1782 ◽  
Author(s):  
Yoichiroh Hosokawa ◽  
Man Hagiyama ◽  
Takanori Iino ◽  
Yoshinori Murakami ◽  
Akihiko Ito
Keyword(s):  
Atomic Force Microscopy ◽  
Femtosecond Laser ◽  
Breaking Force ◽  
Force Microscopy ◽  
Atomic Force ◽  
Laser Impulse

scholarly journals Corneal stromal roughness after VisuMax and Intralase femtosecond laser photodisruption: An atomic force microscopy study

PLoS ONE ◽  
2021 ◽  
Vol 16 (5) ◽  
pp. e0252449
Author(s):  
Juan Gros-Otero ◽  
Samira Ketabi ◽  
Rafael Cañones-Zafra ◽  
Montserrat Garcia-Gonzalez ◽  
Cesar Villa-Collar ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Femtosecond Laser ◽  
Microscopy Study ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Significant Difference ◽  
Surface Measurements ◽  
Bed Roughness ◽  
Flap Creation

Purpose To compare the induced corneal stromal bed roughness measured with atomic force microscopy (AFM) after LASIK flap creation with the IntraLase 60 kHz and the VisuMax femtosecond laser platforms. Methods Three freshly enucleated porcine eyes were operated with each femtosecond laser in this experimental study. Standard LASIK treatment parameters were used for the experiment. After LASIK flap creation, the corneal stromal roughness was assessed using a JPK NanoWizard II® AFM in contact mode immersed in liquid. Olympus OMCL-RC800PSA commercial silicon nitride cantilever tips were used. Surface measurements were made in 10 regions of the central cornea of each sample measuring 20 x 20 microns, at 512 x 512 point resolution. Roughness was measured using the root-mean-square (RMS) value within the given regions. Results Measurements from 30 regions of the 3 eyes (10 measurements per eye) in the Intralase (FS1) group, and 30 regions of the 3 eyes (10 measurements per eye) in the VisuMax (FS2) group were analyzed. There was a statistically significant difference in mean ± standard deviation RMS values between the FS1 and the FS2 groups (360 ± 120 versus 230 ± 100 nm respectively; P< 0.00001). Conclusion This AFM study indicates that the surface of the stromal bed after LASIK flap creation is smoother in the FS2 group than the FS1 group.

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