scholarly journals Synergistic effects of total ionizing dose on the single event effect sensitivity of static random access memory

2014 ◽  
Vol 63 (1) ◽  
pp. 018501
Author(s):  
Xiao Yao ◽  
Guo Hong-Xia ◽  
Zhang Feng-Qi ◽  
Zhao Wen ◽  
Wang Yan-Ping ◽  
...  
Keyword(s):  
Synergistic Effects ◽  
Random Access ◽  
Random Access Memory ◽  
Static Random Access Memory ◽  
Single Event ◽  
Total Ionizing Dose ◽  
Access Memory ◽  
Single Event Effect

scholarly journals Comparison of neutron induced single event upsets in 14 nm FinFET and 65 nm planar static random access memory devices

2020 ◽  
Vol 69 (5) ◽  
pp. 056101
Author(s):  
Zhan-Gang Zhang ◽  
Zhi-Feng Lei ◽  
Teng Tong ◽  
Xiao-Hui Li ◽  
Song-Lin Wang ◽  
...  
Keyword(s):  
Random Access ◽  
Random Access Memory ◽  
Static Random Access Memory ◽  
Memory Devices ◽  
Single Event ◽  
Access Memory ◽  
Single Event Upsets

Analysis of Total Ionizing Dose Effects on a Pseudo-Static Random Access Memory (PSRAM)

2012 ◽  
Vol 49 (1) ◽  
pp. 69-76
Author(s):  
T. H. Both ◽  
G. I. Wirth ◽  
E. C. F. Pereira Junior ◽  
O. L. Goncalez ◽  
R. G. Vaz ◽  
...  
Keyword(s):  
Random Access ◽  
Random Access Memory ◽  
Static Random Access Memory ◽  
Total Ionizing Dose ◽  
Access Memory ◽  
Dose Effects ◽  
Total Ionizing Dose Effects

scholarly journals Single event upsets sensitivity of low energy proton in nanometer static random access memory

2016 ◽  
Vol 65 (6) ◽  
pp. 068501
Author(s):  
Luo Yin-Hong ◽  
Zhang Feng-Qi ◽  
Wang Yan-Ping ◽  
Wang Yuan-Ming ◽  
Guo Xiao-Qiang ◽  
...  
Keyword(s):  
Random Access ◽  
Random Access Memory ◽  
Low Energy ◽  
Static Random Access Memory ◽  
Single Event ◽  
Access Memory ◽  
Single Event Upsets ◽  
Energy Proton
Sign in / Sign up

Export Citation Format

Share Document