scholarly journals Single event upsets sensitivity of low energy proton in nanometer static random access memory

2016 ◽  
Vol 65 (6) ◽  
pp. 068501
Author(s):  
Luo Yin-Hong ◽  
Zhang Feng-Qi ◽  
Wang Yan-Ping ◽  
Wang Yuan-Ming ◽  
Guo Xiao-Qiang ◽  
...  
Keyword(s):  
Random Access ◽  
Random Access Memory ◽  
Low Energy ◽  
Static Random Access Memory ◽  
Single Event ◽  
Access Memory ◽  
Single Event Upsets ◽  
Energy Proton

scholarly journals Comparison of neutron induced single event upsets in 14 nm FinFET and 65 nm planar static random access memory devices

2020 ◽  
Vol 69 (5) ◽  
pp. 056101
Author(s):  
Zhan-Gang Zhang ◽  
Zhi-Feng Lei ◽  
Teng Tong ◽  
Xiao-Hui Li ◽  
Song-Lin Wang ◽  
...  
Keyword(s):  
Random Access ◽  
Random Access Memory ◽  
Static Random Access Memory ◽  
Memory Devices ◽  
Single Event ◽  
Access Memory ◽  
Single Event Upsets

Electron-Induced Single-Event Upsets in Static Random Access Memory

2013 ◽  
Vol 60 (6) ◽  
pp. 4122-4129 ◽  
Author(s):  
M. P. King ◽  
R. A. Reed ◽  
R. A. Weller ◽  
M. H. Mendenhall ◽  
R. D. Schrimpf ◽  
...  
Keyword(s):  
Random Access ◽  
Random Access Memory ◽  
Static Random Access Memory ◽  
Single Event ◽  
Access Memory ◽  
Single Event Upsets

Single-Event Upset Test of Static Random Access Memory Using Single-Ion Microprobe

1992 ◽  
Vol 31 (Part 1, No. 12A) ◽  
pp. 4025-4028 ◽  
Author(s):  
Takashi Matsukawa ◽  
Katsunori Noritake ◽  
Meishoku Koh ◽  
Ken-ichi Hara ◽  
Makoto Goto ◽  
...  
Keyword(s):  
Random Access ◽  
Random Access Memory ◽  
Static Random Access Memory ◽  
Ion Microprobe ◽  
Single Event Upset ◽  
Single Event ◽  
Access Memory

Single-Event Response of 22 nm Fully-Depleted Silicon-on-Insulator Static Random Access Memory

2021 ◽  
pp. 1-1
Author(s):  
Megan C. Casey ◽  
Scott D. Stansberry ◽  
Christina M. Seidleck ◽  
Jeffrey A. Maharrey ◽  
Dante Gamboa ◽  
...  
Keyword(s):  
Random Access ◽  
Random Access Memory ◽  
Silicon On Insulator ◽  
Static Random Access Memory ◽  
Single Event ◽  
Access Memory ◽  
Fully Depleted ◽  
Event Response
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