scholarly journals Research on the total dose irradiation effect of partial-depletion-silicon-on insulator static random access memory

2012 ◽  
Vol 61 (10) ◽  
pp. 106103
Author(s):  
Li Ming ◽  
Yu Xue-Feng ◽  
Xue Yao-Guo ◽  
Lu Jian ◽  
Cui Jiang-Wei ◽  
...  
Keyword(s):  
Total Dose ◽  
Random Access ◽  
Random Access Memory ◽  
Silicon On Insulator ◽  
Static Random Access Memory ◽  
Irradiation Effect ◽  
Access Memory ◽  
Dose Irradiation ◽  
Partial Depletion

scholarly journals Online and offline test method of total dose radiation damage on static random access memory

2014 ◽  
Vol 63 (8) ◽  
pp. 086101
Author(s):  
Cong Zhong-Chao ◽  
Yu Xue-Feng ◽  
Cui Jiang-Wei ◽  
Zheng Qi-Wen ◽  
Guo Qi ◽  
...  
Keyword(s):  
Total Dose ◽  
Radiation Damage ◽  
Random Access ◽  
Random Access Memory ◽  
Test Method ◽  
Static Random Access Memory ◽  
Access Memory ◽  
Dose Radiation

Study on the dose rate upset effect of partially depleted silicon-on-insulator static random access memory

2008 ◽  
Vol 17 (12) ◽  
pp. 4599-4605
Author(s):  
Zhao Fa-Zhan ◽  
Liu Meng-Xin ◽  
Guo Tian-Lei ◽  
Liu Gang ◽  
Hai Chao-He ◽  
...  
Keyword(s):  
Dose Rate ◽  
Random Access ◽  
Random Access Memory ◽  
Silicon On Insulator ◽  
Static Random Access Memory ◽  
Access Memory

scholarly journals Total ionizing dose effects on innovative silicon-on-insulator static random access memory cell

2019 ◽  
Vol 68 (16) ◽  
pp. 168501
Author(s):  
Shuo Wang ◽  
Yong-Wei Chang ◽  
Jing Chen ◽  
Ben-Yan Wang ◽  
Wei-Wei He ◽  
...  
Keyword(s):  
Random Access ◽  
Memory Cell ◽  
Random Access Memory ◽  
Silicon On Insulator ◽  
Static Random Access Memory ◽  
Total Ionizing Dose ◽  
Access Memory ◽  
Dose Effects ◽  
Total Ionizing Dose Effects

Single-Event Response of 22 nm Fully-Depleted Silicon-on-Insulator Static Random Access Memory

2021 ◽  
pp. 1-1
Author(s):  
Megan C. Casey ◽  
Scott D. Stansberry ◽  
Christina M. Seidleck ◽  
Jeffrey A. Maharrey ◽  
Dante Gamboa ◽  
...  
Keyword(s):  
Random Access ◽  
Random Access Memory ◽  
Silicon On Insulator ◽  
Static Random Access Memory ◽  
Single Event ◽  
Access Memory ◽  
Fully Depleted ◽  
Event Response

A Robust Silicon-on-Insulator Static-Random-Access-Memory Architecture by using Advanced Actively Body-Bias Controlled Technology

2008 ◽  
Vol 47 (4) ◽  
pp. 2092-2096
Author(s):  
Yuuichi Hirano ◽  
Mikio Tsujiuchi ◽  
Kozo Ishikawa ◽  
Hirofumi Shinohara ◽  
Takashi Terada ◽  
...  
Keyword(s):  
Random Access ◽  
Random Access Memory ◽  
Silicon On Insulator ◽  
Static Random Access Memory ◽  
Memory Architecture ◽  
Access Memory ◽  
Body Bias
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