scholarly journals Theoretical study on electric-pulse-induced resistance change in perovskite Pr1－xCaxMnO3 films

2007 ◽  
Vol 56 (3) ◽  
pp. 1637
Author(s):  
Li Qian ◽  
Wang Zhi-Guo ◽  
Liu Su ◽  
Xing Zhong-Wen ◽  
Liu Mei
Keyword(s):  
Induced Resistance ◽  
Theoretical Study ◽  
Electric Pulse ◽  
Resistance Change

Electric-pulse-induced resistance change in Ba0.5Sr0.5Co0.2Fe0.8O3 thin films

2010 ◽  
Vol 107 (2) ◽  
pp. 023706 ◽  
Author(s):  
Z. W. Xing ◽  
N. J. Wu ◽  
A. Ignatiev
Keyword(s):  
Thin Films ◽  
Induced Resistance ◽  
Electric Pulse ◽  
Resistance Change

Laser Failure Isolation Techniques Demonstrated On Test Structures

2008 ◽  
Author(s):  
Frank S. Arnold
Keyword(s):  
Integrated Circuits ◽  
Laser Beam ◽  
Case Studies ◽  
Induced Resistance ◽  
Simple Test ◽  
Resistance Change ◽  
Cross Sectional ◽  
Beam Focusing ◽  
Isolation Techniques ◽  
Heating Effects

Abstract To be better prepared to use laser based failure isolation techniques on field failures of complex integrated circuits, simple test structures without any failures can be used to study Optical Beam Induced Resistance Change (OBIRCH) results. In this article, four case studies are presented on the following test structures: metal strap, contact string, VIA string, and comb test structure. Several experiments were done to investigate why an OBIRCH image was seen in certain areas of a VIA string and not in others. One experiment showed the OBRICH variation was not related to the cooling and heating effects of the topology, or laser beam focusing. A 4 point probe resistance measurement and cross-sectional views correlated with the OBIRCH results and proved OBIRCH was able to detect a variation in VIA fabrication.

Investigating carrier transport paths in organic nonvolatile bistable memory by optical beam induced resistance change

2011 ◽  
Vol 12 (10) ◽  
pp. 1632-1637 ◽  
Author(s):  
Heng-Tien Lin ◽  
Chang-Yu Lin ◽  
Zingway Pei ◽  
Jun-Rong Chen ◽  
Yi-Jen Chan ◽  
...  
Keyword(s):  
Induced Resistance ◽  
Carrier Transport ◽  
Optical Beam ◽  
Resistance Change

Low temperature electric pulse induced resistance switching in Na0.5−δCoO2

2008 ◽  
Vol 93 (15) ◽  
pp. 152110 ◽  
Author(s):  
G. Garbarino ◽  
M. Núñez-Regueiro ◽  
M. Armand ◽  
P. Lejay
Keyword(s):  
Low Temperature ◽  
Induced Resistance ◽  
Electric Pulse ◽  
Resistance Switching

scholarly journals Resistance Reduction of Conductive Patterns Printed on Textile by Curing Shrinkage of Passivation Layers

Micromachines ◽  
2020 ◽  
Vol 11 (6) ◽  
pp. 539 ◽  
Author(s):  
Tomoya Koshi ◽  
Ken-ichi Nomura ◽  
Manabu Yoshida
Keyword(s):  
Induced Resistance ◽  
Tensile Deformation ◽  
Curing Temperature ◽  
Electronic Textiles ◽  
Resistance Change ◽  
Resistance Increase ◽  
Resistance Reduction ◽  
Passivation Layers ◽  
Curing Shrinkage ◽  
Initial Resistance

Directly printing conductive ink on textiles is simple and compatible with the conventional electronics manufacturing process. However, the conductive patterns thus formed often show high initial resistance and significant resistance increase due to tensile deformation. Achieving conductive patterns with low initial resistance and reduced deformation-induced resistance increase is a significant challenge in the field of electronic textiles (e-textiles). In this study, the passivation layers printed on conductive patterns, which are necessary for practical use, were examined as a possible solution. Specifically, the reduction of the initial resistance and deformation-induced resistance increase, caused by the curing shrinkage of passivation layers, were theoretically and experimentally investigated. In the theoretical analysis, to clarify the mechanism of the reduction of deformation-induced resistance increase, crack propagation in conductive patterns was analyzed. In the experiments, conductive patterns with and without shrinking passivation layers (polydimethylsiloxane) cured at temperatures of 20–120 °C were prepared, and the initial resistances and resistance increases due to cyclic tensile and washing in each case were compared. As a result, the initial resistance was reduced further by the formation of shrinking passivation layers cured at higher temperatures, and reduced to 0.45 times when the curing temperature was 120 °C. The cyclic tensile and washing tests confirmed a 0.48 and a 0.011 times reduction of resistance change rate after the 100th elongation cycle (10% in elongation rate) and the 10th washing cycle, respectively, by comparing the samples with and without shrinking passivation layers cured at 120 °C.

scholarly journals Strain-induced resistance change in V2O3 films on piezoelectric ceramic disks

2019 ◽  
Vol 125 (11) ◽  
pp. 115102 ◽  
Author(s):  
Joe Sakai ◽  
Maxime Bavencoffe ◽  
Beatrice Negulescu ◽  
Patrice Limelette ◽  
Jérôme Wolfman ◽  
...  
Keyword(s):  
Induced Resistance ◽  
Piezoelectric Ceramic ◽  
Resistance Change
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