Electric-pulse-induced resistance change in Ba0.5Sr0.5Co0.2Fe0.8O3 thin films

2010 ◽  
Vol 107 (2) ◽  
pp. 023706 ◽  
Author(s):  
Z. W. Xing ◽  
N. J. Wu ◽  
A. Ignatiev
Keyword(s):  
Thin Films ◽  
Induced Resistance ◽  
Electric Pulse ◽  
Resistance Change

scholarly journals Theoretical study on electric-pulse-induced resistance change in perovskite Pr1－xCaxMnO3 films

2007 ◽  
Vol 56 (3) ◽  
pp. 1637
Author(s):  
Li Qian ◽  
Wang Zhi-Guo ◽  
Liu Su ◽  
Xing Zhong-Wen ◽  
Liu Mei
Keyword(s):  
Induced Resistance ◽  
Theoretical Study ◽  
Electric Pulse ◽  
Resistance Change

Chemical Solution Deposition Growth of La0.7Ca0.3MnO3 Films and their Electric Pulse Induced Resistance Change Effect

2007 ◽  
Vol 280-283 ◽  
pp. 473-476
Author(s):  
Rui Dong ◽  
Qun Wang ◽  
Li Dong Chen ◽  
Xiao Min Li
Keyword(s):  
Thin Films ◽  
Chemical Solution Deposition ◽  
Electric Pulse ◽  
Chemical Solution ◽  
Resistance Change ◽  
Solution Deposition ◽  
Chemical Solution Deposition Method ◽  
Change Effect ◽  
Simple Chemical ◽  
Coating Method

A simple chemical solution deposition method was developed for the preparation of La0.7Ca0.3MnO3 (LCMO) thin films. The LCMO thin films were prepared on Si/SiO2/TiO2/Pt substrates by spin-coating method, followed by heat-treatment at 900°C. The fabrication process of the LCMO thin film was investigated by means of TG-DSC, FTIR, XRD, FE-SEM and EPMA. The electric pulse induced reversible resistance switching is observed in the Ag-LCMO-Pt sandwich structure.

Laser Failure Isolation Techniques Demonstrated On Test Structures

2008 ◽  
Author(s):  
Frank S. Arnold
Keyword(s):  
Integrated Circuits ◽  
Laser Beam ◽  
Case Studies ◽  
Induced Resistance ◽  
Simple Test ◽  
Resistance Change ◽  
Cross Sectional ◽  
Beam Focusing ◽  
Isolation Techniques ◽  
Heating Effects

Abstract To be better prepared to use laser based failure isolation techniques on field failures of complex integrated circuits, simple test structures without any failures can be used to study Optical Beam Induced Resistance Change (OBIRCH) results. In this article, four case studies are presented on the following test structures: metal strap, contact string, VIA string, and comb test structure. Several experiments were done to investigate why an OBIRCH image was seen in certain areas of a VIA string and not in others. One experiment showed the OBRICH variation was not related to the cooling and heating effects of the topology, or laser beam focusing. A 4 point probe resistance measurement and cross-sectional views correlated with the OBIRCH results and proved OBIRCH was able to detect a variation in VIA fabrication.

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