scholarly journals Thick‐Film Resistor Failure Analysis Based on Low‐Frequency Noise Measurements

2017 ◽  
Author(s):  
Ivanka Stanimirović
Keyword(s):  
Failure Analysis ◽  
Thick Film ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Film Resistor ◽  
Noise Measurements ◽  
Thick Film Resistor

Low Frequency Noise and TCR Mechanisms in Polymer Thick Film Resistors

2010 ◽  
Vol 7 (2) ◽  
pp. 105-110
Author(s):  
B. Poornaiah ◽  
G. Srinivasa Rao ◽  
A.V. Prathap Kumar ◽  
Y. Srinivasa Rao
Keyword(s):  
Thick Film ◽  
Volume Fraction ◽  
Low Frequency ◽  
High Volume ◽  
Current Noise ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Film Resistor ◽  
Thick Film Resistor ◽  
Resistance Fluctuations

The paper aims to propose a more realistic low frequency noise and TCR mechanisms in polymer thick film resistors. The variation of low frequency noise (also called current noise) and TCR of polymer thick film resistor, namely, PVC-graphite thick film resistor, with parameters such as high volume fraction and grain size has been studied. A model is proposed to explain the observed variations, which assumes that the texture of the polymer thick film resistor consists of densely packed conducting particles with a cavity at the center of the structure. Further, the effect of the cavity diameter of polymer thick film resistor on current noise and TCR is explained using the same model. The current noise of these resistors is controlled mainly by the average relative resistance fluctuations between the conducting particles and the number of contacts each particle has with its neighbors. The TCR of these resistors is controlled mainly by the expansion properties of the insulating medium. The variation of TCR with high voltage is also due to the change in number of contacts and the contact area between the conducting particles.

scholarly journals LOW-FREQUENCY NOISE MEASUREMENTS OF IR PHOTODETECTORS WITH VOLTAGE CROSS CORRELATION SYSTEM

Measurement ◽  
2021 ◽  
pp. 109867
Author(s):  
Krzysztof ACHTENBERG ◽  
Janusz MIKOŁAJCZYK ◽  
Carmine CIOFI ◽  
Graziella SCANDURRA ◽  
Krystian MICHALCZEWSKI ◽  
...  
Keyword(s):  
Cross Correlation ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Ir Photodetectors ◽  
Noise Measurements ◽  
Correlation System

Low-Frequency Noise Measurements as a Quality Indicator for Ohmic Contacts to n-GaN

2003 ◽  
Vol 433-436 ◽  
pp. 677-680 ◽  
Author(s):  
Nobuhisa Tanuma ◽  
Hirokazu Tanizaki ◽  
Saburo Yokokura ◽  
T. Matsui ◽  
Sumihisa Hashiguchi ◽  
...  
Keyword(s):  
Quality Indicator ◽  
Ohmic Contacts ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Measurements
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