Risk assessment and forest pest management

1991 ◽  
Vol 67 (5) ◽  
pp. 486-492
Author(s):  
Frank N. Dost

Prediction of potential harm, or risk assessment, is essential to planning for any vegetation management method, but the concepts and process are often not understood. This discussion is a highly simplistic description of the basic elements of toxicology and estimation of risk in excess of the high normal background. All chemical risk is directly related to the dose acquired by the subject or population. In the case of cancer, added human risk that may be associated with very low doses is expressed as a probability that is estimated by extrapolation from observations at high dose rates. Reasons for such an indirect approach and weaknesses of the present process are described.

Author(s):  
M. Isaacson ◽  
M.L. Collins ◽  
M. Listvan

Over the past five years it has become evident that radiation damage provides the fundamental limit to the study of blomolecular structure by electron microscopy. In some special cases structural determinations at very low doses can be achieved through superposition techniques to study periodic (Unwin & Henderson, 1975) and nonperiodic (Saxton & Frank, 1977) specimens. In addition, protection methods such as glucose embedding (Unwin & Henderson, 1975) and maintenance of specimen hydration at low temperatures (Taylor & Glaeser, 1976) have also shown promise. Despite these successes, the basic nature of radiation damage in the electron microscope is far from clear. In general we cannot predict exactly how different structures will behave during electron Irradiation at high dose rates. Moreover, with the rapid rise of analytical electron microscopy over the last few years, nvicroscopists are becoming concerned with questions of compositional as well as structural integrity. It is important to measure changes in elemental composition arising from atom migration in or loss from the specimen as a result of electron bombardment.


Author(s):  
D.T. Grubb

Diffraction studies in polymeric and other beam sensitive materials may bring to mind the many experiments where diffracted intensity has been used as a measure of the electron dose required to destroy fine structure in the TEM. But this paper is concerned with a range of cases where the diffraction pattern itself contains the important information.In the first case, electron diffraction from paraffins, degraded polyethylene and polyethylene single crystals, all the samples are highly ordered, and their crystallographic structure is well known. The diffraction patterns fade on irradiation and may also change considerably in a-spacing, increasing the unit cell volume on irradiation. The effect is large and continuous far C94H190 paraffin and for PE, while for shorter chains to C 28H58 the change is less, levelling off at high dose, Fig.l. It is also found that the change in a-spacing increases at higher dose rates and at higher irradiation temperatures.


2021 ◽  
Author(s):  
Konrad P. Nesteruk ◽  
Michele Togno ◽  
Martin Grossmann ◽  
Anthony J. Lomax ◽  
Damien C. Weber ◽  
...  

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