scholarly journals Advanced Nanomeasuring Techniques for Surface Characterization

ISRN Optics ◽  
2012 ◽  
Vol 2012 ◽  
pp. 1-23 ◽  
Author(s):  
Salah H. R. Ali
Keyword(s):  
Scanning Probe Microscopy ◽  
Surface Characterization ◽  
Technical Committee ◽  
Scanning Probe ◽  
Nanometer Scale ◽  
Measuring Techniques ◽  
Basic Approaches ◽  
Computing Measuring ◽  
Areal Surface

Advanced precise and accurate nanomeasurement techniques play an important role to improve the function and quality of surface characterization. There are two basic approaches, the hard measuring techniques and the soft computing measuring techniques. The advanced soft measuring techniques include coordinate measuring machines, roundness testing facilities, surface roughness, interferometric methods, confocal optical microscopy, scanning probe microscopy, and computed tomography at the level of nanometer scale. On the other hand, a new technical committee in ISO is established to address characterization issues posed by the areal surface texture and measurement methods. This paper reviews the major advanced soft metrology techniques obtained by optical, tactile, and other means using instruments, classification schemes of them, and their applications in the engineering surfaces. Furthermore, future trends under development in this area are presented and discussed to display proposed solutions for the important issues that need to be addressed scientifically.

scholarly journals Focused Electron Beam-Based 3D Nanoprinting for Scanning Probe Microscopy: A Review

Micromachines ◽  
2019 ◽  
Vol 11 (1) ◽  
pp. 48 ◽  
Author(s):  
Harald Plank ◽  
Robert Winkler ◽  
Christian H. Schwalb ◽  
Johanna Hütner ◽  
Jason D. Fowlkes ◽  
...  
Keyword(s):  
Electron Beam ◽  
Scanning Probe Microscopy ◽  
Surface Characterization ◽  
Scale Up ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Nano Fabrication ◽  
Essential Surface ◽  
Ideal Tool

Scanning probe microscopy (SPM) has become an essential surface characterization technique in research and development. By concept, SPM performance crucially depends on the quality of the nano-probe element, in particular, the apex radius. Now, with the development of advanced SPM modes beyond morphology mapping, new challenges have emerged regarding the design, morphology, function, and reliability of nano-probes. To tackle these challenges, versatile fabrication methods for precise nano-fabrication are needed. Aside from well-established technologies for SPM nano-probe fabrication, focused electron beam-induced deposition (FEBID) has become increasingly relevant in recent years, with the demonstration of controlled 3D nanoscale deposition and tailored deposit chemistry. Moreover, FEBID is compatible with practically any given surface morphology. In this review article, we introduce the technology, with a focus on the most relevant demands (shapes, feature size, materials and functionalities, substrate demands, and scalability), discuss the opportunities and challenges, and rationalize how those can be useful for advanced SPM applications. As will be shown, FEBID is an ideal tool for fabrication/modification and rapid prototyping of SPM-tipswith the potential to scale up industrially relevant manufacturing.

Algorithms for Dynamic Hardness Measurements by Scratch Testing in the Submicron and Nanometer Scale

2013 ◽  
Vol 853 ◽  
pp. 619-624
Author(s):  
Natalia Lvova ◽  
K. Kravchuk ◽  
I. Shirokov
Keyword(s):  
Contact Area ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Nanometer Scale ◽  
Geometrical Parameters ◽  
Scratch Testing ◽  
Dynamic Hardness ◽  
Probe Microscopy ◽  
Parameters Analysis

The automatic scratch geometrical parameters analysis algorithms based on the images obtained by scanning probe microscopy have been developed. We provide a description of the technique to determine the contact area and the scratch volume with and without account of the pile-ups. The developed algorithms are applied to measure the dynamic hardness by sclerometry on the submicron and nanometer scale.

Laser Induced Nanofabrication on Titanium Thin Films

1995 ◽  
Vol 397 ◽  
Author(s):  
B.D. Huey ◽  
D.A. Bonnell ◽  
A.D. Akhsakhalian ◽  
A.A. Gorbunov ◽  
A. Sewing ◽  
...  
Keyword(s):  
Thin Films ◽  
Scanning Probe Microscopy ◽  
Optical Resolution ◽  
Diffraction Limit ◽  
Scanning Probe ◽  
Nanometer Scale ◽  
Ion Laser ◽  
Titanium Thin Films ◽  
Novel Structures ◽  
Argon Ion

ABSTRACTIllumination of titanium thin films with an argon-ion laser has been used to fabricate nanometer scale features by localized oxidation. The laser induces a temperature gradient in the metal film, within which oxidation may occur. Due to the non-linearity of the reaction with temperature, the reaction zone can be laterally confined to regions narrower than the diffraction limit of optical resolution. Scanning probe microscopy indicates widths ranging from 105 to 600 nm and heights of 0.8 to 30 nm. The possibility of forming novel structures is demonstrated.

Optimum KOH Wet Etching of Cantilever Tip for Better Image Captured by Nanoeducator

2011 ◽  
Vol 84-85 ◽  
pp. 392-395
Author(s):  
Agus Geter Edy Sutjipto ◽  
Waleed Fekry Faris ◽  
Erry Y.T. Adesta ◽  
Hafizah Hanim
Keyword(s):  
Scanning Probe Microscopy ◽  
Atomic Scale ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Etching Time ◽  
Atomic Force ◽  
Measuring Techniques ◽  
Quality Image ◽  
Scanning Force ◽  
Microscopy Techniques

The development of the various scanning probe microscopy techniques has revolutionized the study of surface structure up to atomic scale. Among these techniques, Nanoeducator as scanning force microscope or SFM has been developed to allow the accomplishment of various measuring techniques both for scanning tunneling microscope (STM) and non-contact atomic force microscope (AFM). However, there is no exact guidance how to fabricate cantilever to gather the good image. In order to achieve the better cantilever for students, this paper emphasizes on tip’s processing by altering etching length parameter as tip plays an important role to achieve better quality image during scanning operation. This paper also provides a guide for undergraduate student to know better about this machine as well as the principle behind it for them to acquire better quality image for their works. It was found that the number of turning of tungsten and etching time could produce good tip of cantilever. It is recommended for lecturers, students and technician to consider about turning and time of etching to produce a better tip of cantilever in Nanoeducator.

scholarly journals Prospects of scanning probe microscopy for nanometer-scale lithography.

1995 ◽  
Vol 8 (4) ◽  
pp. 669-676 ◽  
Author(s):  
LARRY AKIO NAGAHARA ◽  
HIROTAKA OHNO ◽  
HIROSHI TOKUMOTO
Keyword(s):  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Nanometer Scale ◽  
Probe Microscopy

scholarly journals Surface characterization of InP trenches embedded in oxide using scanning probe microscopy

2015 ◽  
Vol 118 (22) ◽  
pp. 225304 ◽  
Author(s):  
Manuel Mannarino ◽  
Ravi Chintala ◽  
Alain Moussa ◽  
Clement Merckling ◽  
Pierre Eyben ◽  
...  
Keyword(s):  
Scanning Probe Microscopy ◽  
Surface Characterization ◽  
Scanning Probe ◽  
Probe Microscopy

In Situ Electrochemical Scanning Probe Microscopy of Lithium Battery Cathode Materials: Vanadium Pentoxide (V2O5)

2002 ◽  
Vol 756 ◽  
Author(s):  
Joseph W. Bullard ◽  
Richard L. Smith
Keyword(s):  
Scanning Probe Microscopy ◽  
Lithium Battery ◽  
Structural Evolution ◽  
Scanning Probe ◽  
Nanometer Scale ◽  
Force Microscopy ◽  
Atomic Force ◽  
Electrochemical Cycling ◽  
Pit Nucleation

ABSTRACTAtomic force microscopy was used to characterize the structural evolution of the V2O5(001) surface during the electrochemical cycling of lithium. With Li insertion, nanometer-scale pits develop at the V2O5(001) surface. The pits first appear as the composition of the crystal approaches Li0.0006V2O5. Pit nucleation and growth continue through further discharge, resulting in a micro-porous (001) surface morphology. During subsequent Li extraction, cracks develop along the V2O5 <010> axis. Surface regions in the vicinity of these cracks “swell” during ensuing lithiation reactions, suggesting that the cracks locally facilitate Li uptake.

Nanorods Produced on the Surface of Thin Films of TiOx by Surface-Imprinting

2003 ◽  
Vol 787 ◽  
Author(s):  
M. Joseph Roberts ◽  
Scott K. Johnson
Keyword(s):  
Thin Films ◽  
Recent Work ◽  
Scanning Probe Microscopy ◽  
Sol Gel ◽  
Scanning Probe ◽  
Surface Imprinting ◽  
Probe Microscopy ◽  
Sol Gel Films ◽  
Nanoscale Features

ABSTRACTWorldwide, there is great interest in new processes for production of nanoscale features in materials surfaces. Our recent work explores imprinting of nanosized objects into thin films. In this paper, we present results from surface imprinting of TiOx sol-gel films with anodized alumina. Scanning Probe Microscopy provides evidence for the quality of the imprinting process.

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