Atomic Force Microscopic Studies on Microheterogeneity of Blends of Silicone Rubber and Tetrafluoroethylene/Propylene/Vinylidene Fluoride Terpolymer

2003 ◽  
Vol 76 (1) ◽  
pp. 220-238 ◽  
Author(s):  
Arun Ghosh ◽  
R. S. Rajeev ◽  
A. K. Bhattacharya ◽  
A. K. Bhowmick ◽  
S. K. De ◽  
...  
Keyword(s):  
Surface Morphology ◽  
Spectral Density ◽  
Power Spectral Density ◽  
Silicone Rubber ◽  
Vinylidene Fluoride ◽  
Single Component ◽  
Atomic Force ◽  
Power Spectral ◽  
Surface Plot ◽  
Section Analysis

Abstract This paper reports the results of Atomic Force Microscopic (AFM) studies on blends of silicone rubber and fluororubber based on tetrafluoroethylene/propylene/vinylidene fluoride terpolymer. The surface morphology of the single component rubbers and their blends and the effect of the blend ratio on the surface morphology were studied using analysis techniques of AFM images including surface plot, section analysis, roughness analysis and power spectral density analysis. The compatibility of the two rubber phases depends on the dimensions of the granules on the surface, measured from the section analysis and the histograms derived from the section analysis. As predicted by the histograms, the surface morphology of the blends is governed primarily by the silicone rubber, even at low concentration of silicone rubber in the blend. The height image, amplitude image, surface plot and section analysis display a distinct surface morphology for the 50/50-silicone rubber/fluororubber blend. The roughness and power spectral density (PSD) analyses show that the 50/50-blend exhibits maximum surface roughness. The results of surface energy measurements of the single component rubbers and their blends in general conform to the findings of AFM studies.

AFM Methodology for the Measurement of Silicon Wafer Microroughness

1996 ◽  
Vol 440 ◽  
Author(s):  
A.G. Gilicinski ◽  
S.E. Beck ◽  
R.M. Rynders ◽  
D.A. Moniot
Keyword(s):  
Atomic Force Microscopy ◽  
Spectral Density ◽  
Silicon Wafer ◽  
Power Spectral Density ◽  
Cutoff Frequency ◽  
Force Microscopy ◽  
Atomic Force ◽  
Experimental Solution ◽  
Power Spectral ◽  
Afm Probe

AbstractDespite the growing use of atomic force microscopy (AFM) for the measurement of silicon wafer microroughness, no generally accepted method has been developed to deal with issues around accuracy and reproducibility. We review problems that affect these AFM studies and demonstrate the effect of probe tip size on AFM microroughness data. Without knowledge of AFM probe tip geometry, it is impossible to quantitatively compare Ra or RMS microroughness data between different measurements. An experimental solution is to characterize tip sizes during imaging and compare data taken with similar size tips. While this will significantly improve quantitation, it is restrictive in that data taken with different size tips cannot be easily compared. We propose a solution to this problem in the use of power spectral density (PSD) to evaluate microroughness with a “cutoff frequency” at the lateral wavelength where tip effects begin to affect the accuracy of the microroughness measurement. An example of this approach is described

Metal Surface Morphology Characterization Using Laser Scatterometry

1990 ◽  
Vol 181 ◽  
Author(s):  
S. M. Gaspar ◽  
K. C. Hickman ◽  
J. R. McNeil ◽  
R. D. Jacobson ◽  
G. P. Lindauer ◽  
...  
Keyword(s):  
Surface Morphology ◽  
Spectral Density ◽  
Power Spectral Density ◽  
Metal Surface ◽  
Power Spectral ◽  
Morphology Characterization ◽  
Surface Statistics

ABSTRACTWe have applied angle-resolved laser scatterometry to characterize the morphology of metals deposited under various conditions. Scatterometry is a rapid, noncontact and nondestructive diagnostic which yields surface statistics including rms roughness and power spectral density of the microstructure.

Surface Characterization of Carbon Fibers by Atomic Force Microscopy: Roughness Quantification by Power Spectral Density

2017 ◽  
Vol 742 ◽  
pp. 447-456
Author(s):  
Bastian Brück ◽  
Thomas Guglhoer ◽  
Simon Haug ◽  
Christina Kunzmann ◽  
Michael Schulz ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Spectral Density ◽  
Surface Topography ◽  
Power Spectral Density ◽  
Carbon Fibers ◽  
Force Microscopy ◽  
Atomic Force ◽  
Power Spectral ◽  
Local Background

The topography of a surface consists of structures of different length scales. The surface roughness caused by these structures plays a decisive role in interfacial properties. Atomic Force Microscopy (AFM) can be applied to measure the surface topography with great accuracy and thus facilitates roughness quantification. Here, however, the data reduction poses a challenge. In a conventional approach, surface roughness parameters are evaluated based on averaging height differences, which leads to values dominated by the largest height differences of the surface topography. To quantify contributions of smaller structures to the roughness, a previous study presented a tunable local background correction, which eliminates structures on a larger than selected scale. Therefore, this method only considers surface structures smaller than the chosen scale. A different approach to quantify surface roughness on all length scales covered by AFM measurements uses Fourier transformation of the surface topography to calculate the power spectral density, which describes the amplitudes of different contributing spatial frequencies.In the current study, a new approach based on power spectral density is used to quantify surface roughness parameters as a function of the length scale of contributions to the surface topography. This procedure allows a comprehensive characterization of surface roughness and an intuitive comparison of different surfaces.The usefulness of this method and its compatibility to local background correction is demonstrated by analyzing several commercially available carbon fibers with and without different fiber surface treatments.

Fractal-Regular Surface Characterization Based on Experimental Data From Atomic Force Microscopy of Hard Disks

2007 ◽  
Author(s):  
Anne Sasikanth ◽  
Shao Wang
Keyword(s):  
Experimental Data ◽  
Spectral Density ◽  
Power Spectral Density ◽  
Surface Characterization ◽  
Hard Disks ◽  
Fractal Surfaces ◽  
Atomic Force ◽  
Regular Shape ◽  
Power Spectral ◽  
Wide Range

Engineering surfaces should be characterized as fractal-regular surfaces since they possess both a macroscopic regular shape component and a random fractal component. In the present study, surface topography measurements were conducted for magnetic hard disks with an atomic force microscope (AFM). The power spectral density data obtained reveal a regular shape region and two fractal regions, indicating bifractal-regular behavior. By combining the AFM data with previous profilometer data, a complete description of the power spectral density behavior of the measured surfaces was obtained for a wide range of scales from 2 nm to 5 mm. The fractal dimension was found to be 1.935 and 1.186 for the upper fractal region and lower fractal region, respectively. Good agreement between the AFM data and profilometer data was observed in a range of overlapping scales. A multi-section modified Weierstrass-Mandelbrot function has been proposed to simulate bi-fractal surfaces with a power spectral density trend which matches that of experimental data.

scholarly journals Power Spectral Density Analysis for Optimizing SERS Structures

Sensors ◽  
2022 ◽  
Vol 22 (2) ◽  
pp. 593
Author(s):  
Ekaterina Babich ◽  
Sergey Scherbak ◽  
Ekaterina Lubyankina ◽  
Valentina Zhurikhina ◽  
Andrey Lipovskii
Keyword(s):  
Spectral Density ◽  
Power Spectral Density ◽  
Raman Signal ◽  
Metal Structures ◽  
Atomic Force ◽  
Power Spectral ◽  
Surface Enhanced Raman ◽  
Density Analysis ◽  
Power Spectral Density Analysis ◽  
Metal Island

The problem of optimizing the topography of metal structures allowing Surface Enhanced Raman Scattering (SERS) sensing is considered. We developed a model, which randomly distributes hemispheroidal particles over a given area of the glass substrate and estimates SERS capabilities of the obtained structures. We applied Power Spectral Density (PSD) analysis to modeled structures and to atomic force microscope images widely used in SERS metal island films and metal dendrites. The comparison of measured and calculated SERS signals from differing characteristics structures with the results of PSD analysis of these structures has shown that this approach allows simple identification and choosing a structure topography, which is capable of providing the maximal enhancement of Raman signal within a given set of structures of the same type placed on the substrate.

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