Modulus Mapping of Rubbers Using Micro- and Nano-Indentation Techniques

2001 ◽  
Vol 74 (3) ◽  
pp. 428-450 ◽  
Author(s):  
Kenneth T. Gillen ◽  
Edward R. Terrill ◽  
Robb M. Winter
Keyword(s):  
Atomic Force Microscope ◽  
Spatial Resolution ◽  
Tensile Modulus ◽  
Alternative Methods ◽  
Nano Indentation ◽  
Hard Materials ◽  
The Past ◽  
Atomic Force ◽  
Quantitative Estimates ◽  
Interfacial Force

Abstract Modulus measurements are among the most useful properties available for monitoring the cure and aging of rubbers. Historically, such measurements were done on macroscopic samples, but over the past 15 years, several penetration techniques have been and are being developed that allow quantitative estimates of modulus to be made with lateral resolutions of 100 μm or better. This review summarizes these developments and the types of unique information that can be generated on rubbery materials. A large part of the review focuses on the types of results available from a modulus profiling apparatus that has been used to study rubbers for the past 15 years. This instrument allows estimates to be made of the inverse tensile compliance (closely related to Young's tensile modulus) with a lateral resolution of around 50 to 100 μm. Several recently developed alternative methods for achieving similar spatial resolution are also described. Finally, a brief review is given of the recent attempts to measure quantitative modulus values for rubbers with even better resolution using instruments historically focused on metals and other hard materials such as nano-indenters, the atomic force microscope and the interfacial force microscope.

Nano-Grating Fabrication Technique

2006 ◽  
Vol 326-328 ◽  
pp. 131-134 ◽  
Author(s):  
Hui Min Xie ◽  
Zhan Wei Liu ◽  
Ming Zhang ◽  
Peng Wan Chen ◽  
Feng Lei Huang ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Spatial Resolution ◽  
Deformation Measurement ◽  
Fabrication Process ◽  
Fabrication Technique ◽  
Micro Fabrication ◽  
Grating Fabrication ◽  
Atomic Force ◽  
Experimental Parameters ◽  
Moire Method

In this paper, a novel nano-moiré grating fabrication technique was proposed for nanometer deformation measurement. The grating fabrication process was performed with the aid of Atomic Force Microscope (AFM) on the basis of micro-fabrication technique. On the analysis of some correlative factors of influencing grating line quality, some important experimental parameters were optimized. In this study, some parallel and cross nano-gratings with frequencies of from 10000lines/mm to 20000lines/mm were fabricated. The successful experimental results demonstrate that the nano-grating fabrication technique is feasible and also indicated that these nano-gratings with nano-moiré method can be applied to deformation measurement, which offers a nanometer sensitivity and spatial resolution.

CHARACTERIZING LOCALIZED STRAIN OF IN0.83Al0.17As/In0.83Ga0.17As DETECTOR USING LOW FREQUENCY ATOMIC FORCE ACOUSTIC MICROSCOPE

2016 ◽  
Vol 23 (01) ◽  
pp. 1550110
Author(s):  
WEITAO SU ◽  
HONGLEI DOU ◽  
DEXUAN HUO ◽  
GUOLIN YU ◽  
NING DAI
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscope ◽  
Spatial Resolution ◽  
Low Frequency ◽  
Surface Strain ◽  
Strain Accumulation ◽  
Acoustic Microscope ◽  
Atomic Force

Localized strain accumulation and related defects strongly affect the performance of optoelectronic detectors. However, characterizing distribution of the localized strain and defects still challenges usability and spatial resolution of many measurements. In current study, the defects and surface strain accumulation of In[Formula: see text]Al[Formula: see text]As/In[Formula: see text]Ga[Formula: see text]As multilayer detectors are investigated using low-frequency atomic force acoustic microscope (AFAM) and Raman spectroscopy. With AFAM, the strain accumulation and defects can be easily identified and measured with spatial resolution as good as that of atomic force microscope (AFM).

scholarly journals Investigation on Key Parameters in the Fabrication of Stamps for Transfer Printing of Micro Devices

2020 ◽  
Vol 10 (13) ◽  
pp. 4604
Author(s):  
Changwen Su ◽  
Yue Lin ◽  
Tien-Mo Shih ◽  
Hao Lu ◽  
Yang Gao ◽  
...  
Keyword(s):  
Elastic Modulus ◽  
Mathematical Models ◽  
Atomic Force Microscope ◽  
Development Time ◽  
Transfer Printing ◽  
The Past ◽  
Atomic Force ◽  
The Relationship ◽  
Fabrication Parameters ◽  
Printing Method

For the past few years, the transfer printing method has been developed and has secured numerous advantages. Here, via both experiments and analyses, we have focused on identifying key parameters and optimizing their values in the fabrication process of stamps for transfer-printing micro-devices. Specifically, the elastic modulus of posts is measured using the atomic force microscope and the Derjaguin, Muller, and Toporov model. Based on mold morphologies data, we subsequently explore the law of photoresist development under different design widths as well as development time, establish mathematical models, and offer relevant explanations for the formation of various developmental topographies. Furthermore, the relationship between the elastic modulus and these stamp-fabrication parameters has also been analyzed and confirmed. Hopefully, the proposed work can provide the guidance for fabricating reliable stamps in the future.

Mechanical Properties of Poly 3C-SiC Thin Films According to Carrier Gas (H2) Concentration

2008 ◽  
Vol 600-603 ◽  
pp. 867-870
Author(s):  
Gwiy Sang Chung ◽  
Ki Bong Han
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Mechanical Properties ◽  
Surface Roughness ◽  
Atomic Force Microscope ◽  
Young’S Modulus ◽  
Young's Modulus ◽  
Carrier Gas ◽  
Nano Indentation ◽  
Atomic Force

This paper presents the mechanical properties of 3C-SiC thin film according to 0, 7, and 10 % carrier gas (H2) concentrations using Nano-Indentation. When carrier gas (H2) concentration was 10 %, it has been proved that the mechanical properties, Young’s Modulus and Hardness, of 3C-SiC are the best of them. In the case of 10 % carrier gas (H2) concentration, Young’s Modulus and Hardness were obtained as 367 GPa and 36 GPa, respectively. When the surface roughness according to carrier gas (H2) concentrations was investigated by AFM (atomic force microscope), when carrier gas (H2) concentration was 10 %, the roughness of 3C-SiC thin was 9.92 nm, which is also the best of them. Therefore, in order to apply poly 3C-SiC thin films to MEMS applications, carrier gas (H2) concentration’s rate should increase to obtain better mechanical properties and surface roughness.

scholarly journals Unzipping a Membrane

2000 ◽  
Vol 8 (9) ◽  
pp. 3-7
Author(s):  
Stephen W. Carmichael ◽  
Julio M. Fernandez
Keyword(s):  
Silicon Nitride ◽  
Atomic Force Microscope ◽  
Spatial Resolution ◽  
High Resistance ◽  
Outer Surface ◽  
Deinococcus Radiodurans ◽  
Force Spectroscopy ◽  
Test Subject ◽  
Atomic Force ◽  
Inner Surface

The atomic force microscope (AFM) is well known for its outstanding spatial resolution, but it is becoming increasingly useful as the instrument for force spectroscopy. In the force spectroscopy mode, the AFM can measure tiny tension forces, in the piconewton (pN) range. Daniel Müller, Wolfgang Baurmeister, and Andreas Engel have used the AFM in both the imaging and force spectroscopy modes to pull proteins out of membranes in a controlled fashion.Müller et al. used Deinococcus radiodurans, a bacterium best known for its high resistance to radiation (as its Genus name implies), as their test subject. They extracted a highly regular membrane from the bacterium, the hexagonally packed intermediate (HPl) layer. They mounted the HPI on mica, so that the hydrophilic outer surface of the HPI adsorbed strongly to the mica, exposing the hydrophobic inner surface to the silicon nitride AFM stylus.

Image Reconstruction in Atomic Force Microscopy

1997 ◽  
Vol 3 (S2) ◽  
pp. 1261-1262
Author(s):  
M. Cynthia Goh
Keyword(s):  
Atomic Force Microscopy ◽  
Image Reconstruction ◽  
Atomic Force Microscope ◽  
Numerical Algorithm ◽  
Finite Size ◽  
Excluded Volume ◽  
Original Sample ◽  
Force Microscopy ◽  
The Past ◽  
Atomic Force

The atomic force microscope has been an essential tool in the past few years for visualization of mesoscopic structures, and has been applied to numerous examples in biological systems. The finite size of the probe tip, however, means that the picture produced by the AFM inevitably includes the tip geometry convoluted with the desired image of the sample. If the tip is asymmetric and/or deformed, the resulting image may bear little resemblance to the original sample. Even in the case of a “good tip”, however, the effect on the image is non-negligible, causing broadening and obscuring of features. In this presentation, approaches developed in our laboratory with regards to problems in imaging mesoscopic samples will be discussed.In samples where the primary tip-sample interaction is via excluded volume - that is, the tip and sample are mutually impenetrable and come into contact - we had been utilizing a numerical algorithm for removing the tip geometry from the AFM image.

Recent advances in AFM-based biological characterization and applications at multiple levels

Soft Matter ◽  
2020 ◽  
Vol 16 (39) ◽  
pp. 8962-8984
Author(s):  
Wenfeng Liang ◽  
Haohao Shi ◽  
Xieliu Yang ◽  
Junhai Wang ◽  
Wenguang Yang ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Natural Environments ◽  
Biological Characterization ◽  
Force Microscopy ◽  
The Past ◽  
Atomic Force ◽  
Wide Range ◽  
Multiple Levels

Atomic force microscopy (AFM) has found a wide range of bio-applications in the past few decades due to its ability to measure biological samples in natural environments at a high spatial resolution.

scholarly journals Nanomechanical mapping of soft materials with the atomic force microscope: methods, theory and applications

2020 ◽  
Vol 49 (16) ◽  
pp. 5850-5884 ◽  
Author(s):  
Ricardo Garcia
Keyword(s):  
Atomic Force Microscope ◽  
Spatial Resolution ◽  
Viscoelastic Properties ◽  
High Spatial Resolution ◽  
State Of The Art ◽  
Soft Materials ◽  
The State ◽  
Atomic Force

This review provides an introduction to the state-of-the-art force microscope methods to map at high-spatial resolution the elastic and viscoelastic properties of proteins, polymers and cells.

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