scholarly journals Nanomechanical mapping of soft materials with the atomic force microscope: methods, theory and applications

2020 ◽  
Vol 49 (16) ◽  
pp. 5850-5884 ◽  
Author(s):  
Ricardo Garcia
Keyword(s):  
Atomic Force Microscope ◽  
Spatial Resolution ◽  
Viscoelastic Properties ◽  
High Spatial Resolution ◽  
State Of The Art ◽  
Soft Materials ◽  
The State ◽  
Atomic Force

This review provides an introduction to the state-of-the-art force microscope methods to map at high-spatial resolution the elastic and viscoelastic properties of proteins, polymers and cells.

High-Spatial-Resolution Topographic Imaging and Dimer Distance Analysis of Si(100)-(2×1) Using Noncontact Atomic Force Microscopy

2008 ◽  
Vol 47 (7) ◽  
pp. 6085-6087 ◽  
Author(s):  
Daisuke Sawada ◽  
Takashi Namikawa ◽  
Masuhiro Hiragaki ◽  
Yoshiaki Sugimoto ◽  
Masayuki Abe ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Force Microscopy ◽  
Distance Analysis ◽  
Atomic Force ◽  
Topographic Imaging

Modulus Mapping of Rubbers Using Micro- and Nano-Indentation Techniques

2001 ◽  
Vol 74 (3) ◽  
pp. 428-450 ◽  
Author(s):  
Kenneth T. Gillen ◽  
Edward R. Terrill ◽  
Robb M. Winter
Keyword(s):  
Atomic Force Microscope ◽  
Spatial Resolution ◽  
Tensile Modulus ◽  
Alternative Methods ◽  
Nano Indentation ◽  
Hard Materials ◽  
The Past ◽  
Atomic Force ◽  
Quantitative Estimates ◽  
Interfacial Force

Abstract Modulus measurements are among the most useful properties available for monitoring the cure and aging of rubbers. Historically, such measurements were done on macroscopic samples, but over the past 15 years, several penetration techniques have been and are being developed that allow quantitative estimates of modulus to be made with lateral resolutions of 100 μm or better. This review summarizes these developments and the types of unique information that can be generated on rubbery materials. A large part of the review focuses on the types of results available from a modulus profiling apparatus that has been used to study rubbers for the past 15 years. This instrument allows estimates to be made of the inverse tensile compliance (closely related to Young's tensile modulus) with a lateral resolution of around 50 to 100 μm. Several recently developed alternative methods for achieving similar spatial resolution are also described. Finally, a brief review is given of the recent attempts to measure quantitative modulus values for rubbers with even better resolution using instruments historically focused on metals and other hard materials such as nano-indenters, the atomic force microscope and the interfacial force microscope.

scholarly journals Measuring the viscoelastic properties of human platelets with the atomic force microscope

1996 ◽  
Vol 70 (1) ◽  
pp. 556-567 ◽  
Author(s):  
M. Radmacher ◽  
M. Fritz ◽  
C.M. Kacher ◽  
J.P. Cleveland ◽  
P.K. Hansma
Keyword(s):  
Atomic Force Microscope ◽  
Viscoelastic Properties ◽  
Human Platelets ◽  
Atomic Force

Nano-Grating Fabrication Technique

2006 ◽  
Vol 326-328 ◽  
pp. 131-134 ◽  
Author(s):  
Hui Min Xie ◽  
Zhan Wei Liu ◽  
Ming Zhang ◽  
Peng Wan Chen ◽  
Feng Lei Huang ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Spatial Resolution ◽  
Deformation Measurement ◽  
Fabrication Process ◽  
Fabrication Technique ◽  
Micro Fabrication ◽  
Grating Fabrication ◽  
Atomic Force ◽  
Experimental Parameters ◽  
Moire Method

In this paper, a novel nano-moiré grating fabrication technique was proposed for nanometer deformation measurement. The grating fabrication process was performed with the aid of Atomic Force Microscope (AFM) on the basis of micro-fabrication technique. On the analysis of some correlative factors of influencing grating line quality, some important experimental parameters were optimized. In this study, some parallel and cross nano-gratings with frequencies of from 10000lines/mm to 20000lines/mm were fabricated. The successful experimental results demonstrate that the nano-grating fabrication technique is feasible and also indicated that these nano-gratings with nano-moiré method can be applied to deformation measurement, which offers a nanometer sensitivity and spatial resolution.

Viscoelastic Properties of Single Polysaccharide Molecules Determined by Analysis of Thermally Driven Oscillations of an Atomic Force Microscope Cantilever

Langmuir ◽  
2004 ◽  
Vol 20 (21) ◽  
pp. 9299-9303 ◽  
Author(s):  
Masaru Kawakami ◽  
Katherine Byrne ◽  
Bhavin Khatri ◽  
Tom C. B. Mcleish ◽  
Sheena E. Radford ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Viscoelastic Properties ◽  
Atomic Force Microscope Cantilever ◽  
Atomic Force ◽  
Thermally Driven ◽  
Force Microscope Cantilever

CHARACTERIZING LOCALIZED STRAIN OF IN0.83Al0.17As/In0.83Ga0.17As DETECTOR USING LOW FREQUENCY ATOMIC FORCE ACOUSTIC MICROSCOPE

2016 ◽  
Vol 23 (01) ◽  
pp. 1550110
Author(s):  
WEITAO SU ◽  
HONGLEI DOU ◽  
DEXUAN HUO ◽  
GUOLIN YU ◽  
NING DAI
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscope ◽  
Spatial Resolution ◽  
Low Frequency ◽  
Surface Strain ◽  
Strain Accumulation ◽  
Acoustic Microscope ◽  
Atomic Force

Localized strain accumulation and related defects strongly affect the performance of optoelectronic detectors. However, characterizing distribution of the localized strain and defects still challenges usability and spatial resolution of many measurements. In current study, the defects and surface strain accumulation of In[Formula: see text]Al[Formula: see text]As/In[Formula: see text]Ga[Formula: see text]As multilayer detectors are investigated using low-frequency atomic force acoustic microscope (AFAM) and Raman spectroscopy. With AFAM, the strain accumulation and defects can be easily identified and measured with spatial resolution as good as that of atomic force microscope (AFM).

AFM-Based Chemical and Mechanical Property Characterization of Interconnects and Defects

2013 ◽  
Author(s):  
Michael Lo ◽  
Eoghan Dillon ◽  
Qichi Hu ◽  
Kevin Kjoller ◽  
Roshan Shetty ◽  
...  
Keyword(s):  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Bulk Material ◽  
Liquid Crystal Display ◽  
Spectroscopic Characterization ◽  
Mechanical Analysis ◽  
Atomic Force ◽  
Spectroscopic Information ◽  
Contact Resonance

Abstract Spectroscopic characterization of interconnects and circuits in semiconductor devices has become increasingly complicated as dimensions for breakthroughs and failure analysis are continuously shrinking. To achieve high spatial resolution infrared (IR) spectroscopic information, a pulsed infrared laser can be coupled to an atomic force microscope in the atomic force microscopy IR (AFM-IR) technique. The combination of AFM-IR and Lorentz contact resonance AFM (LCR-AFM) has great potential for providing high spatial resolution chemical and mechanical analysis. To demonstrate the feasibility of the AFM-based techniques, AFM-IR spectrum and images were obtained from the interlayer dielectrics of a test structure at a length scale shorter than the IR wavelength. Using the LCR-AFM technique, the relative mechanical properties of the components could be mapped distinctively by observing the contact resonance of the AFM probe. Finally, preliminary data suggest there may be AFM-IR spectral differences between contamination and the bulk material on a liquid crystal display.

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