scholarly journals Analysis of Subthreshold Leakage Current in IP3 SRAM Bit-Cell under Temperature Variations in Deep-Submicrometer CMOS Technology

2012 ◽  
Vol 51 (19) ◽  
pp. 1-4
Author(s):  
Neeraj Kr.Shukla ◽  
Shilpi Birla ◽  
Saksham Dembla
2008 ◽  
Vol 8 (3) ◽  
pp. 501-508 ◽  
Author(s):  
Xiaobin Yuan ◽  
Jae-Eun Park ◽  
Jing Wang ◽  
Enhai Zhao ◽  
David C. Ahlgren ◽  
...  

Author(s):  
Turki Alnuayri ◽  
Saqib Khursheed ◽  
Antonio Leonel Hernandez Martinez ◽  
Daniele Rossi

2001 ◽  
Vol 89 (4) ◽  
pp. 556-573 ◽  
Author(s):  
F. Caignet ◽  
S. Delmas-Bendhia ◽  
E. Sicard

Author(s):  
Xiaobin Yuan ◽  
Jae-Eun Park ◽  
Jing Wang ◽  
Enhai Zhao ◽  
David Ahlgren ◽  
...  

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