Analysis of Subthreshold Leakage Current in IP3 SRAM Bit-Cell under Temperature Variations in Deep-Submicrometer CMOS Technology
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2011 ◽
pp. 738-742
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1992 ◽
Vol 39
(1)
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pp. 118-126
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2008 ◽
Vol 8
(3)
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pp. 501-508
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