Analysis of the Effect of Temperature Variations on Sub-threshold Leakage Current in P3 and P4 SRAM Cells at Deep Sub-micron CMOS Technology
Keyword(s):
Keyword(s):
1988 ◽
Vol 54
(499)
◽
pp. 565-570
◽
2008 ◽
Vol 8
(3)
◽
pp. 501-508
◽
2021 ◽
2020 ◽
Vol 9
(1)
◽
pp. 164-171
2007 ◽
pp. 1369-1374
2015 ◽
Vol 106
(1)
◽
pp. 28-38
◽