A leakage current mechanism caused by the interaction of residual oxidation stress and high-energy ion implantation impact in advanced CMOS technology

1999 ◽  
Vol 20 (5) ◽  
pp. 251-253 ◽  
Author(s):  
Hyeokjac Lee ◽  
Jeong Mo Hwang ◽  
Young June Park ◽  
Hong Shick Min
Keyword(s):  
Ion Implantation ◽  
Leakage Current ◽  
Cmos Technology ◽  
High Energy ◽  
Oxidation Stress ◽  
Leakage Current Mechanism ◽  
Current Mechanism

scholarly journals Heavy-Ion Microbeam Studies of Single-Event Leakage Current Mechanism in SiC VD-MOSFETs

2020 ◽  
Vol 67 (7) ◽  
pp. 1381-1389
Author(s):  
C. Martinella ◽  
T. Ziemann ◽  
R. Stark ◽  
A. Tsibizov ◽  
K. O. Voss ◽  
...  
Keyword(s):  
Leakage Current ◽  
Heavy Ion ◽  
Single Event ◽  
Leakage Current Mechanism ◽  
Current Mechanism

Oxygen Stability and Leakage Current Mechanism in Ferroelectric La-Substituted Bi4Ti3O12Single Crystals

2005 ◽  
Vol 44 (9B) ◽  
pp. 6998-7002 ◽  
Author(s):  
Yuji Noguchi ◽  
Masayuki Soga ◽  
Masatake Takahashi ◽  
Masaru Miyayama
Keyword(s):  
Leakage Current ◽  
Leakage Current Mechanism ◽  
Current Mechanism

Characteristics of Junction Leakage Current of Buried Layer Formed by High Energy Ion Implantation

1990 ◽  
Author(s):  
T. Kuroi ◽  
S. Komori ◽  
H. Miyatake ◽  
K. Tsukamoto ◽  
Y. Akasaka
Keyword(s):  
Ion Implantation ◽  
Leakage Current ◽  
High Energy ◽  
Buried Layer

scholarly journals A review of leakage current mechanism in nitride based light emitting diode

2016 ◽  
Vol 12 (2) ◽  
Author(s):  
Anati Syahirah Hedzir ◽  
Norasmahan Muridan ◽  
Nurul Fadzlin Hasbullah
Keyword(s):  
Leakage Current ◽  
Light Emitting Diode ◽  
Forward Bias ◽  
Dominant Mechanism ◽  
Light Emitting ◽  
Fluorescent Lamps ◽  
High Bias ◽  
Assisted Tunneling ◽  
Leakage Current Mechanism ◽  
Current Mechanism

We review the dominant mechanism and characteristics of it which gave rise to the existence of forward and reverse leakage current in nitride based light emitting diode (LED). LED is one of the promising device to be used as a lighting source because it does not contain mercury unlike fluorescent lamps. However, the existence of leakage current can affect the reliability and efficiency of LED. Hence, its importance to understand the mechanism that responsible for its existence. The occurrence of leakage current is divided into three main parameters: 1) low bias; 2) medium or high bias; 3) temperature dependence. In low reverse bias, Poole-Frenkel is the dominant mechanism while tunneling is the dominant mechanism in high bias region. Furthermore, in forward bias, defect assisted tunneling is most likely the dominant mechanism. In low forward bias, electrons are the dominant carriers in defect assisted tunneling while in medium forward bias, holes are the dominant carriers.  Moreover, Variable Range Hopping (VRH) is reported to be dominant when the temperature of conduction is below 200K. 

Reverse bias leakage current mechanism of AlGaN/InGaN/GaN heterostructure

2016 ◽  
Vol 12 (2) ◽  
pp. 232-236 ◽  
Author(s):  
Apurba Chakraborty ◽  
Saptarsi Ghosh ◽  
Partha Mukhopadhyay ◽  
Sanjay K. Jana ◽  
Syed Mukulika Dinara ◽  
...  
Keyword(s):  
Leakage Current ◽  
Reverse Bias ◽  
Leakage Current Mechanism ◽  
Gan Heterostructure ◽  
Current Mechanism
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