Analysis of the Effect of Temperature and Vdd on Leakage Current in Conventional 6TSRAM BitCell at 90nm and 65nm Technology
2011 ◽
Vol 26
(1)
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pp. 44-48
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2015 ◽
pp. 206-209
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1967 ◽
Vol 25
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pp. 312-313
1995 ◽
Vol 53
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pp. 640-641
1990 ◽
Vol 80
(3)
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pp. 431-436
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