scholarly journals Characterization of Ultra Low-k SiOC(H) Film Deposited by Plasma-Enhanced Chemical Vapor Deposition (PECVD)

2012 ◽  
Vol 13 (2) ◽  
pp. 69-72 ◽  
Author(s):  
Sang-Yong Kim
2001 ◽  
Vol 148 (7) ◽  
pp. F148 ◽  
Author(s):  
Licheng M. Han ◽  
Ji-Sheng Pan ◽  
Shou-Mian Chen ◽  
N. Balasubramanian ◽  
Jianou Shi ◽  
...  

2015 ◽  
Vol 32 (6) ◽  
pp. 638
Author(s):  
Xingmin Cai ◽  
Xiaoqiang Su ◽  
Fan Ye ◽  
Huan Wang ◽  
Guangxing Liang ◽  
...  

2020 ◽  
Vol 13 (7) ◽  
pp. 075505
Author(s):  
Tomohiro Yamaguchi ◽  
Hiroki Nagai ◽  
Takanori Kiguchi ◽  
Nao Wakabayashi ◽  
Takuto Igawa ◽  
...  

Author(s):  
A. Ramos-Carrazco ◽  
J. A. Gallardo-Cubedo ◽  
A. Vera-Marquina ◽  
A. L. Leal-Cruz ◽  
J. R. Noriega ◽  
...  

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