Characterization of Ultra Low-k SiOC(H) Film Deposited by Plasma-Enhanced Chemical Vapor Deposition (PECVD)
2012 ◽
Vol 13
(2)
◽
pp. 69-72
◽
2001 ◽
Vol 148
(7)
◽
pp. F148
◽
Keyword(s):
Keyword(s):
2002 ◽
Vol 20
(3)
◽
pp. 828
◽
Keyword(s):
2007 ◽
Vol 46
(4A)
◽
pp. 1415-1426
◽