scholarly journals Improved Application of Carbon Nanotube Atomic Force Microscopy Probes Using PeakForce Tapping Mode

Nanomaterials ◽  
2018 ◽  
Vol 8 (10) ◽  
pp. 807 ◽  
Author(s):  
Ashley Slattery ◽  
Cameron Shearer ◽  
Joseph Shapter ◽  
Adam Blanch ◽  
Jamie Quinton ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Great Promise ◽  
Stable Operation ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Imaging Mode ◽  
Resolution Imaging ◽  
Vertical Step

In this work PeakForce tapping (PFT) imaging was demonstrated with carbon nanotube atomic force microscopy (CNT-AFM) probes; this imaging mode shows great promise for providing simple, stable imaging with CNT-AFM probes, which can be difficult to apply. The PFT mode is used with CNT-AFM probes to demonstrate high resolution imaging on samples with features in the nanometre range, including a Nioprobe calibration sample and gold nanoparticles on silicon, in order to demonstrate the modes imaging effectiveness, and to also aid in determining the diameter of very thin CNT-AFM probes. In addition to stable operation, the PFT mode is shown to eliminate “ringing” artefacts that often affect CNT-AFM probes in tapping mode near steep vertical step edges. This will allow for the characterization of high aspect ratio structures using CNT-AFM probes, an exercise which has previously been challenging with the standard tapping mode.

Frequency Response of Carbon Nanotube Probes during Tapping Mode of Atomic Force Microscopy

2013 ◽  
Vol 378 ◽  
pp. 466-471
Author(s):  
Po Jen Shih ◽  
Shang Hao Cai
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Atomic Force Microscope ◽  
Frequency Response ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Frequency Responses ◽  
Atomic Force ◽  
Frequency Drop ◽  
Atomic Force Microscope Measurement

The dynamic behaviors of carbon nanotube probes applied in Atomic Force Microscope measurement are of interest in advanced nanoscalar topography. In this paper, we developed the characteristic equations and applied the model analysis to solve the eigenvalues of the microcantilever and the carbon nanotube. The eigenvalues were then used in the tapping mode system to predict the frequency responses against the tip-sample separations. It was found that the frequency drop steeply if the separation was less than certain distances. This instability of frequency is deduced from the jump of microcantilever or the jump of the carbon nanotube. Various lengths and binding angles of the carbon nanotube were considered, and the results indicated that the binding angle dominated the frequency responses and jumps.

Complex Dynamics of Carbon Nanotube Probe Tips

2003 ◽  
Author(s):  
Soo Il Lee ◽  
Arvind Raman ◽  
Stephen W. Howell ◽  
Ron Reifenberger ◽  
Cattien V. Nguyen ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Complex Dynamics ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Control Schemes ◽  
Nonlinear Features ◽  
Resolution Imaging ◽  
Distance Data ◽  
Tapping Mode Afm

Carbon nanotube (CNT) tips in tapping mode atomic force microscopy (AFM) enable very high-resolution imaging, measurements, and manipulation at the nanoscale. We present recent results based on experimental analysis that yield new insights into the dynamics of CNT probe tips in tapping mode AFM. Experimental measurements are presented of the static response, the frequency response and dynamic amplitude-distance data of a high-aspect-ratio multi-walled (MW) CNT tip to demonstrate the nonlinear features including tip amplitude saturation preceding the dynamic buckling of the MWCNT. The differences between the nonlinear tapping mode response of CNT tips are compared with previously known results on the nonlinear response of conventional tips. Surface scanning is performed using a MWCNT tip on a SiO2 grating to verify the imaging instabilities associated with MWCNT buckling when used with normal control schemes in the tapping mode. Lastly, the choice of optimal setpoints for tapping mode control using CNT tip are discussed using the experimental results.

Analysis of a Bi-Harmonic Tapping Mode for Atomic Force Microscopy

2013 ◽  
Author(s):  
Muthukumaran Loganathan ◽  
Douglas A. Bristow
Keyword(s):  
Atomic Force Microscopy ◽  
Feedback Loop ◽  
Mechanical Sensitivity ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Imaging Mode ◽  
Trajectory Dynamics ◽  
Mode Tm

The tapping mode (TM) is a popularly used imaging mode in atomic force microscopy (AFM). A feedback loop regulates the amplitude of the tapping cantilever by adjusting the offset between the probe and sample; the image is generated from the control action. This paper explores the role of the trajectory of the tapping cantilever in the accuracy of the acquired image. This paper demonstrates that reshaping the cantilever trajectory alters the amplitude response to changes in surface topography, effectively altering the mechanical sensitivity of the instrument. Trajectory dynamics are analyzed to determine the effect on mechanical sensitivity and analysis of the feedback loop is used to determine the effect on image accuracy. Experimental results validate the analysis, demonstrating better than 30% improvement in mechanical sensitivity using certain trajectories. Images obtained using these trajectories exhibit improved sharpness and surface tracking, especially at high scan speeds.

scholarly journals Amplitude response of conical multiwalled carbon nanotube probes for atomic force microscopy

RSC Advances ◽  
2019 ◽  
Vol 9 (1) ◽  
pp. 429-434 ◽  
Author(s):  
Xiao Hu ◽  
Hang Wei ◽  
Ya Deng ◽  
Xiannian Chi ◽  
Jia Liu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Atomic Force Microscope ◽  
Axial Compression ◽  
Multiwalled Carbon Nanotube ◽  
Amplitude Response ◽  
Multiwalled Carbon ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force

Impressive stability of conical carbon nanotube atomic force microscope probes is shown under axial compression during tapping mode.

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