Complex Dynamics of Carbon Nanotube Probe Tips

2003 ◽  
Author(s):  
Soo Il Lee ◽  
Arvind Raman ◽  
Stephen W. Howell ◽  
Ron Reifenberger ◽  
Cattien V. Nguyen ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Complex Dynamics ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Control Schemes ◽  
Nonlinear Features ◽  
Resolution Imaging ◽  
Distance Data ◽  
Tapping Mode Afm

Carbon nanotube (CNT) tips in tapping mode atomic force microscopy (AFM) enable very high-resolution imaging, measurements, and manipulation at the nanoscale. We present recent results based on experimental analysis that yield new insights into the dynamics of CNT probe tips in tapping mode AFM. Experimental measurements are presented of the static response, the frequency response and dynamic amplitude-distance data of a high-aspect-ratio multi-walled (MW) CNT tip to demonstrate the nonlinear features including tip amplitude saturation preceding the dynamic buckling of the MWCNT. The differences between the nonlinear tapping mode response of CNT tips are compared with previously known results on the nonlinear response of conventional tips. Surface scanning is performed using a MWCNT tip on a SiO2 grating to verify the imaging instabilities associated with MWCNT buckling when used with normal control schemes in the tapping mode. Lastly, the choice of optimal setpoints for tapping mode control using CNT tip are discussed using the experimental results.

scholarly journals Improved Application of Carbon Nanotube Atomic Force Microscopy Probes Using PeakForce Tapping Mode

Nanomaterials ◽  
2018 ◽  
Vol 8 (10) ◽  
pp. 807 ◽  
Author(s):  
Ashley Slattery ◽  
Cameron Shearer ◽  
Joseph Shapter ◽  
Adam Blanch ◽  
Jamie Quinton ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Great Promise ◽  
Stable Operation ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Imaging Mode ◽  
Resolution Imaging ◽  
Vertical Step

In this work PeakForce tapping (PFT) imaging was demonstrated with carbon nanotube atomic force microscopy (CNT-AFM) probes; this imaging mode shows great promise for providing simple, stable imaging with CNT-AFM probes, which can be difficult to apply. The PFT mode is used with CNT-AFM probes to demonstrate high resolution imaging on samples with features in the nanometre range, including a Nioprobe calibration sample and gold nanoparticles on silicon, in order to demonstrate the modes imaging effectiveness, and to also aid in determining the diameter of very thin CNT-AFM probes. In addition to stable operation, the PFT mode is shown to eliminate “ringing” artefacts that often affect CNT-AFM probes in tapping mode near steep vertical step edges. This will allow for the characterization of high aspect ratio structures using CNT-AFM probes, an exercise which has previously been challenging with the standard tapping mode.

Frequency Response of Carbon Nanotube Probes during Tapping Mode of Atomic Force Microscopy

2013 ◽  
Vol 378 ◽  
pp. 466-471
Author(s):  
Po Jen Shih ◽  
Shang Hao Cai
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Atomic Force Microscope ◽  
Frequency Response ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Frequency Responses ◽  
Atomic Force ◽  
Frequency Drop ◽  
Atomic Force Microscope Measurement

The dynamic behaviors of carbon nanotube probes applied in Atomic Force Microscope measurement are of interest in advanced nanoscalar topography. In this paper, we developed the characteristic equations and applied the model analysis to solve the eigenvalues of the microcantilever and the carbon nanotube. The eigenvalues were then used in the tapping mode system to predict the frequency responses against the tip-sample separations. It was found that the frequency drop steeply if the separation was less than certain distances. This instability of frequency is deduced from the jump of microcantilever or the jump of the carbon nanotube. Various lengths and binding angles of the carbon nanotube were considered, and the results indicated that the binding angle dominated the frequency responses and jumps.

Comparison study of live cells by atomic force microscopy, confocal microscopy, and scanning electrochemical microscopy

2007 ◽  
Vol 85 (3) ◽  
pp. 175-183 ◽  
Author(s):  
Xiaocui Zhao ◽  
Nils O Petersen ◽  
Zhifeng Ding
Keyword(s):  
Atomic Force Microscopy ◽  
Confocal Microscopy ◽  
Scanning Electrochemical Microscopy ◽  
Time Lapse ◽  
Live Cells ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Tapping Mode Afm ◽  
Electrochemical Microscopy

In this report, three kinds of scanning probe microscopy techniques, atomic force microscopy (AFM), confocal microscopy (CM), and scanning electrochemical microscopy (SECM), were used to study live cells in the physiological environment. Two model cell lines, CV-1 and COS-7, were studied. Time-lapse images were obtained with both contact and tapping mode AFM techniques. Cells were more easily scratched or moved by contact mode AFM than by tapping mode AFM. Detailed surface structures such as filamentous structures on the cell membrane can be obtained and easily discerned with tapping mode AFM. The toxicity of ferrocenemethanol (Fc) on live cells was studied by CM in reflection mode by recording the time-lapse images of controlled live cells and live cells with different Fc concentrations. No significant change in the morphology of cells was caused by Fc. Cells were imaged by SECM with Fc as the mediator at a biased potential of 0.35 V (vs. Ag/AgCl with a saturated KCl solution). Cells did not change visibly within 1 h, which indicated that SECM was a noninvasive technique and thus has a unique advantage for the study of soft cells, since the electrode scanned above the cells instead of in contact with them. Reactive oxygen species (ROS) generated by the cells were detected and images based on these chemical species were obtained. It is demonstrated that SECM can provide not only the topographical images but also the images related to the chemical or biochemical species released by the live cells.Key words: live cells, atomic force microscopy, confocal microscopy, scanning electrochemical microscopy.

Scanning Tunneling Microscopy and Atomic Force Microscopy of Au Implanted in Highly Oriented Pyrolytic Graphite

1995 ◽  
Vol 396 ◽  
Author(s):  
Y S. Tung ◽  
A. Ueda ◽  
D.O. Henderson ◽  
R. Mu ◽  
Z. Gu ◽  
...  
Keyword(s):  
Pyrolytic Graphite ◽  
Constant Current ◽  
Scanning Tunneling ◽  
Highly Oriented Pyrolytic Graphite ◽  
Tunneling Microscopy ◽  
Gold Colloids ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Tapping Mode Afm

AbstractSurfaces of highly oriented pyrolytic graphite implanted with gold were studied by both constant current STM. constant force, and tapping mode AFM. Gold colloids were observed by both constant current STM and tapping mode AFM. The surfaces can be modified by applying currents of +4 V and 1 nA. In addition, pyramidal and faceted structures were observed on sample surfaces suggesting the presence of diamond microcrystals.

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