Amplitude Response of Multiwalled Carbon Nanotube Probe with Controlled Length during Tapping Mode Atomic Force Microscopy

2008 ◽  
Vol 112 (40) ◽  
pp. 15631-15636 ◽  
Author(s):  
A. N. Jiang ◽  
S. Gao ◽  
X. L. Wei ◽  
X. L. Liang ◽  
Q. Chen
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Multiwalled Carbon Nanotube ◽  
Amplitude Response ◽  
Multiwalled Carbon ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

scholarly journals Amplitude response of conical multiwalled carbon nanotube probes for atomic force microscopy

RSC Advances ◽  
2019 ◽  
Vol 9 (1) ◽  
pp. 429-434 ◽  
Author(s):  
Xiao Hu ◽  
Hang Wei ◽  
Ya Deng ◽  
Xiannian Chi ◽  
Jia Liu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Atomic Force Microscope ◽  
Axial Compression ◽  
Multiwalled Carbon Nanotube ◽  
Amplitude Response ◽  
Multiwalled Carbon ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force

Impressive stability of conical carbon nanotube atomic force microscope probes is shown under axial compression during tapping mode.

Tapping Mode Atomic Force Microscopy Studies of the Photoreduction of Ag+on Individual Submicrometer TiO2Particles

Langmuir ◽  
1999 ◽  
Vol 15 (25) ◽  
pp. 8569-8573 ◽  
Author(s):  
William E. Farneth ◽  
R. Scott McLean ◽  
John D. Bolt ◽  
Eleni Dokou ◽  
Mark A. Barteau
Keyword(s):  
Atomic Force Microscopy ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy
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