scholarly journals Amplitude response of conical multiwalled carbon nanotube probes for atomic force microscopy

RSC Advances ◽  
2019 ◽  
Vol 9 (1) ◽  
pp. 429-434 ◽  
Author(s):  
Xiao Hu ◽  
Hang Wei ◽  
Ya Deng ◽  
Xiannian Chi ◽  
Jia Liu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Atomic Force Microscope ◽  
Axial Compression ◽  
Multiwalled Carbon Nanotube ◽  
Amplitude Response ◽  
Multiwalled Carbon ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force

Impressive stability of conical carbon nanotube atomic force microscope probes is shown under axial compression during tapping mode.

Frequency Response of Carbon Nanotube Probes during Tapping Mode of Atomic Force Microscopy

2013 ◽  
Vol 378 ◽  
pp. 466-471
Author(s):  
Po Jen Shih ◽  
Shang Hao Cai
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Atomic Force Microscope ◽  
Frequency Response ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Frequency Responses ◽  
Atomic Force ◽  
Frequency Drop ◽  
Atomic Force Microscope Measurement

The dynamic behaviors of carbon nanotube probes applied in Atomic Force Microscope measurement are of interest in advanced nanoscalar topography. In this paper, we developed the characteristic equations and applied the model analysis to solve the eigenvalues of the microcantilever and the carbon nanotube. The eigenvalues were then used in the tapping mode system to predict the frequency responses against the tip-sample separations. It was found that the frequency drop steeply if the separation was less than certain distances. This instability of frequency is deduced from the jump of microcantilever or the jump of the carbon nanotube. Various lengths and binding angles of the carbon nanotube were considered, and the results indicated that the binding angle dominated the frequency responses and jumps.

Microcantilever chaotic motion suppression in tapping mode atomic force microscope

2012 ◽  
Vol 227 (8) ◽  
pp. 1730-1741 ◽  
Author(s):  
José Manoel Balthazar ◽  
Angelo Marcelo Tusset ◽  
Silvio Luiz Thomaz de Souza ◽  
Atila Madureira Bueno
Keyword(s):  
Atomic Force Microscopy ◽  
Feedback Control ◽  
Atomic Force Microscope ◽  
Chaotic Motion ◽  
Delayed Feedback Control ◽  
Linear Feedback ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Wide Range

The tapping mode is one of the mostly employed techniques in atomic force microscopy due to its accurate imaging quality for a wide variety of surfaces. However, chaotic microcantilever motion impairs the obtention of accurate images from the sample surfaces. In order to investigate the problem the tapping mode atomic force microscope is modeled and chaotic motion is identified for a wide range of the parameter's values. Additionally, attempting to prevent the chaotic motion, two control techniques are implemented: the optimal linear feedback control and the time-delayed feedback control. The simulation results show the feasibility of the techniques for chaos control in the atomic force microscopy.

scholarly journals Improved Application of Carbon Nanotube Atomic Force Microscopy Probes Using PeakForce Tapping Mode

Nanomaterials ◽  
2018 ◽  
Vol 8 (10) ◽  
pp. 807 ◽  
Author(s):  
Ashley Slattery ◽  
Cameron Shearer ◽  
Joseph Shapter ◽  
Adam Blanch ◽  
Jamie Quinton ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Great Promise ◽  
Stable Operation ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Imaging Mode ◽  
Resolution Imaging ◽  
Vertical Step

In this work PeakForce tapping (PFT) imaging was demonstrated with carbon nanotube atomic force microscopy (CNT-AFM) probes; this imaging mode shows great promise for providing simple, stable imaging with CNT-AFM probes, which can be difficult to apply. The PFT mode is used with CNT-AFM probes to demonstrate high resolution imaging on samples with features in the nanometre range, including a Nioprobe calibration sample and gold nanoparticles on silicon, in order to demonstrate the modes imaging effectiveness, and to also aid in determining the diameter of very thin CNT-AFM probes. In addition to stable operation, the PFT mode is shown to eliminate “ringing” artefacts that often affect CNT-AFM probes in tapping mode near steep vertical step edges. This will allow for the characterization of high aspect ratio structures using CNT-AFM probes, an exercise which has previously been challenging with the standard tapping mode.

Sign in / Sign up

Export Citation Format

Share Document