Surface Preparation and Deposited Gate Oxides for Gallium Nitride Based Metal Oxide Semiconductor Devices
Keyword(s):
Reliability of Nitrided Gate Oxides for N- and P-Type 4H-SiC(0001) Metal–Oxide–Semiconductor Devices
2011 ◽
Vol 50
(9R)
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pp. 090201
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Keyword(s):
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2009 ◽
Vol 27
(3)
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pp. 1261
Keyword(s):
2011 ◽
Vol 32
(7)
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pp. 076001
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